Time-digital converter and time measuring device and method

Abstract

The invention discloses a time-digital converter which comprises M NOT gates sequentially connected in series. The input end of the first NOT gate receives starting triggering signals. The output end of the Mth NOT gate provides counter triggering signals. The first input ends and the second input ends of (M-1) exclusive-OR gates are connected with the output end of the corresponding NOT gate and the output end of the next NOT gate. A counter receives the counter triggering signals and counts the counter triggering signals. A data combination module is connected with the output ends of the M NOT gates, the output ends of the (M-1) exclusive-OR gate and the output end of the counter and receives termination triggering signals. Measuring data representing the time interval are generated according to the output of the M NOT gates and the output of the counter. Calibration data representing the measuring state are generated according to the (M-1) exclusive-OR gates. According to the time-digital converter, the tiny time interval between dynamic circuit signals can be accurately tested, meanwhile, the real-time calibration function is achieved, measurement abnormity and mistakes can be found in time, the follow-up measuring process is terminated, and the circuit testing and verification cost is saved.

Description

technical field [0001] The invention belongs to the field of integrated circuit testing, and in particular relates to a time-to-digital converter, a time measurement device and a measurement method thereof. Background technique [0002] In the whole process of integrated circuit research and development, trial production and mass production, it is necessary to use instruments and equipment with high precision and high performance to carry out meticulous and rigorous testing and verification of integrated circuits to ensure that the performance of the product can reach certain indicators and quality. A certain guarantee can be obtained, and at the same time, defective products can be effectively found and eliminated in the production process to ensure 100% shipment of integrated circuits that meet the standards. [0003] In integrated circuit testing, time measurement is an essential test item. For example, the measurement of the time interval between an integrated circuit r...

AI Technical Summary

Problems solved by technology

[0005] Another method is to pass the signal through the delay line to calculate the delay time, but the defect of this method is that the abnormalities and errors in the measurement process cannot be found in time

Even if the signal to be tested is abnormal, the entire measurement process cannot be terminated, but the entire measurement process must be completed, which wastes valuable production test time and cannot catch signal anomalies and errors that occur during the measurement process.

Therefore, the time measurement method based on the delay line can only be used in the laboratory as an auxiliary test method for research, and cannot be applied in the large-scale integrated circuit production process at all.

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