Thin film transistor array substrate and display device

Abstract

The invention relates to the field of display technology, and discloses a thin film transistor array substrate and a display device. A detection line is provided on the array substrate to transmit a signal for detecting DGS. When DGS occurs, the detection signal is input from the gate line (or data line) through the unidirectional conduction element and output from the data line (or gate line). , and an alarm component is set at the end of the data line (or gate line), the alarm component receives the detection signal and outputs a corresponding alarm signal. Among them, the one-to-one correspondence between the unidirectional conductive element and the position of the grid line (or data line), and the one-to-one correspondence between the position of the alarm element and the data line (or grid line), by obtaining the alarm signal, the position where DGS occurs can be determined . Even after assembling the module, just turn off the module and input the detection signal to perform DGS detection. The setting of the one-way conducting element makes the setting of the detection component not affect the normal operation of the module.

Description

technical field [0001] The invention relates to the field of display technology, in particular to a thin film transistor array substrate and a display device. Background technique [0002] DGS (Data Gate Short, gate line and data line short circuit) is one of the common defects of thin film transistor liquid crystal display devices. At present, the means of detecting DGS are very limited, and only when the thin film transistor array substrate is just completed, DGS can be detected in the production line. When the module is assembled, if DGS occurs, the detection means are very limited, and it is even impossible to accurately find the location of DGS. Moreover, if the location where the DGS occurs cannot be found during the product development process, the product development process will be delayed. Contents of the invention [0003] The invention provides a thin film transistor array substrate, which is used for detecting the occurrence position of DGS. [0004] The pr...

AI Technical Summary

Problems solved by technology

At present, the means of detecting DGS are very limited. Only when the thin film transistor array substrate is just completed, DGS can be detected in the production line.

When the module is assembled, if DGS occurs, the detection methods are very limited, and it is even impossible to accurately find the location of DGS

Moreover, if the location of DGS cannot be found during the product development process, the product development process will be delayed.

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