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Projection device and depth measurement system

A technology of projection device and projection lens, which is applied to measurement devices, projection devices, optical devices, etc., can solve the problems of difficult operation, waste, bulky, etc., and achieve the effects of high accuracy, low cost, and high operation speed.

Active Publication Date: 2016-09-21
YOUNG OPTICS
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The most typical projection device used in the past was a slide projector. The slide projector required a mechanism to switch slides, resulting in bulky and cumbersome operation. LCOS panel for short) or digital micro-mirror device (DMD for short) video projector, although the bulkiness is improved, but the equipment of the projector is not only expensive but also only projects a few patterns, so it seems wasteful

Method used

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  • Projection device and depth measurement system
  • Projection device and depth measurement system
  • Projection device and depth measurement system

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Embodiment Construction

[0052] The aforementioned and other technical contents, features and effects of the present invention will be clearly presented in the following detailed description of a preferred embodiment with reference to the drawings. The directional terms mentioned in the following embodiments, such as: up, down, left, right, front or back, etc., are only referring to the directions of the drawings. Accordingly, the directional terms are used to illustrate and not to limit the invention.

[0053] Figure 1A is a schematic structural diagram of a depth measurement system according to the first embodiment of the present invention, and Figure 1B yes Figure 1A A schematic diagram of a projection device in . Please refer to Figure 1A , in this embodiment, the depth measurement system 100 includes a projection device 100 a and a camera device 220 . The depth measurement system 100 is used to measure the surface depth of the object under test 10, wherein the depth of the object under test...

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Abstract

The invention provides a projection device and a depth measurement system. The projection device comprises at least one light source, at least one pattern unit, and a projection lens. The light source provides an illumination light beam, and the pattern unit is provided with a fixed pattern and arranged at a transmission path of the illumination light beam, so as to convert the illumination light beam into a pattern light beam. The projection lens is arranged at the transmission path of the pattern light beam. The light source provides at least one light-emitting combination. The pattern light beam is correspondingly provided with at least one pattern combination. The invention also provides the depth measurement system.

Description

technical field [0001] The present invention relates to an optical device and a measurement system, and in particular to a projection device and a depth measurement system. Background technique [0002] Coded structured light is considered a reliable technique for exploring the topography of object surfaces. Structured light refers to some light with specific patterns, ranging from the simplest lines, surfaces to more complex graphics such as grids. [0003] The basic principle is to project structured light onto an object or scene and take images from one or more perspectives. Since the pattern is coded, the correspondence between the captured point and the projected point can be easily found. The decoded points can use the trigonometric function method to solve the three-dimensional information of the object. Application examples include target distance detection, inspection of manufactured parts, reverse engineering, gesture recognition, and 3D map creation. [0004] ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G03B21/14G03B21/20G01B11/25G01B11/22
CPCG01B11/22G01B11/254G01B11/30G03B21/2013G03B21/2073
Inventor 张吉龙庄庚翰康博铨
Owner YOUNG OPTICS