Method for estimating and compensating bistatic scattering influence on polarimetric calibration dihedral reflector

Abstract

The invention discloses a method for estimating and compensating the bistatic scattering influence on a polarimetric calibration dihedral reflector. The method comprises the following steps: through analysis on the scattering mechanism of the dihedral reflector, estimating the influence of a bistatic scattering condition on the scattering field of the dihedral reflector; according to an estimation formula, compensating the bistatic scattering influence on a measurement result of the dihedral reflector so as to improve the subsequent polarimetric calibration precision. The method is extremely high in practicality; by the method, the bistatic scattering influence on the dihedral reflector rotating around a radar sightline for different angles can be estimated; by the method, the influence of the bistatic scattering on scattering characteristic measurement of the dihedral reflector is successfully estimated and compensated, so that the polarimetric calibration precision is improved.

Description

technical field [0001] The invention relates to the technical field of communication and radar, in particular to a method for estimating and compensating the bistatic scattering effect of a polarization calibration dihedral reflector. Background technique [0002] In the measurement of radar target polarization scattering matrix, it is necessary to eliminate the measurement error caused by the imperfect measurement system through polarization calibration technology. In polarization calibration technology, a metal dihedral reflector is a commonly used passive calibration body. Usually, the echoes at two different angles of rotation around the radar line of sight are measured as calibration signals, and combined with the measurement signals of other calibration objects (such as metal balls, metal plates, etc.), the relevant polarization calibration parameters can be extracted, and then the polarization can be completed. Calibration [see literature 1]. The schematic diagram o...

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Problems solved by technology

[0029] The technical problem to be solved by the present invention is: in the polarization scattering measurement using dual antennas, the measurement error of the dihedral reflector used for polarization calibration is large under the condition of small dual station angle measurement, which in turn leads to polarization calibration errors Big problem, the present invention proposes a kind of new signal processing method according to the bistatic electromagnetic scattering mechanism of the dihedral angle reflector, adopts this method to estimate and compensate the magnitude error that the bistatic angle reflector brings to the dihedral angle reflector measurement result , the equivalent single-station measurement results obtained after compensating for this error are used for polarization calibration processing, which can greatly improve the polarization calibration accuracy

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