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Monitoring device and method, display substrate cutting and edging device

A technology for display substrates and monitoring devices, applied in automatic control devices, measuring devices, grinding devices, etc., can solve the problems of display substrate cutting, inability to judge temperature changes during cutting, damage, etc., and achieve stable cutting and edging quality. , the effect of high cutting and edging benefits

Inactive Publication Date: 2017-10-27
HEFEI BOE OPTOELECTRONICS TECH +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] At present, the size of large-scale display substrates is getting larger and larger, and the thickness is thinner, only 0.4, 0.5 mm. Then, because the temperature change during cutting cannot be judged during the cutting process, the display substrates will be cracked and damaged.

Method used

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  • Monitoring device and method, display substrate cutting and edging device
  • Monitoring device and method, display substrate cutting and edging device
  • Monitoring device and method, display substrate cutting and edging device

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Embodiment Construction

[0050] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention more clear, the following will clearly and completely describe the technical solutions of the embodiments of the present invention in conjunction with the drawings of the embodiments of the present invention. Apparently, the described embodiments are some, not all, embodiments of the present invention. All other embodiments obtained by those skilled in the art based on the described embodiments of the present invention belong to the protection scope of the present invention.

[0051] Unless otherwise defined, the technical terms or scientific terms used herein shall have the usual meanings understood by those skilled in the art to which the present invention belongs. "First", "second" and similar words used in the patent application specification and claims of the present invention do not indicate any order, quantity or importance, but are only used to distinguis...

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Abstract

The invention provides a monitoring device and method, and a display substrate cutting and edging device, which are configured to detect the temperature at the contact point between the cutter wheel and the display substrate during the cutting or edging process of the display substrate by the cutter wheel, and obtain An infrared temperature detection module for temperature parameters at the contact point; and a processing module for generating corresponding control parameters based on the temperature parameters, and the control parameters are used to control the cutting or edging process of the display substrate, thereby Infrared temperature measurement technology can be used to judge the position accuracy of cutting and the status of the cutter wheel based on the temperature field change at the contact point between the cutter wheel and the display substrate during the cutting and edging process of the display substrate, so as to realize more stable cutting and edging of the display substrate quality, and higher display substrate cutting and edging benefits.

Description

technical field [0001] The present invention relates to the field of display technology, in particular to a monitoring device and method, and a display substrate cutting and edging device. Background technique [0002] Since flat panel displays, such as liquid crystal displays (LCD: Liquid Crystal Display), organic light emitting diode displays (OLED: Organic Light-Emitting Diode), source matrix organic light emitting diode displays (AMOLED: Active Matrix / Organic Light Emitting Diode), etc., have light , Thin, low power consumption, etc., are widely used in modern electronic products such as TVs, notebook computers, mobile phones, personal digital assistants, etc. [0003] An important component in a flat panel display is a display substrate, such as an array substrate or a color filter substrate. In the manufacturing process of the display substrate, it is necessary to use a cutter wheel to cut a large display substrate (such as a glass substrate) into a plurality of indep...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G05B19/406B24B9/10
CPCB24B9/10B24B49/14G05B19/406G01J2005/0033G01J5/0022B23Q15/12G05B2219/37426G05B2219/45145G05B2219/45161G05B2219/49073G05B2219/37355B24B49/16B24B55/02B24B37/015G01J5/07G05B19/182G05B2219/37367
Inventor 井杨坤吴卫民车晓盼黎海波李桂孙健夏俊伟丁甲
Owner HEFEI BOE OPTOELECTRONICS TECH