Testing device and testing method for forming limit diagram under high-temperature constant-strain rate condition

A technology of constant strain rate and forming limit diagram, which is applied in the direction of applying stable tension/compression to test the strength of materials, so as to eliminate the strain rate factor and facilitate research

Inactive Publication Date: 2015-06-24
JILIN UNIV
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Problems solved by technology

The patents with application numbers 201110082554.7, 201210238542.3 and 201310337979.7 all involve high-temperature forming limit test devices and how to obtain high-temperature forming limit diagrams, but the existing high-temperatur

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  • Testing device and testing method for forming limit diagram under high-temperature constant-strain rate condition
  • Testing device and testing method for forming limit diagram under high-temperature constant-strain rate condition
  • Testing device and testing method for forming limit diagram under high-temperature constant-strain rate condition

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Embodiment Construction

[0046] The present invention will be further described below in conjunction with the accompanying drawings and specific embodiments.

[0047] refer to Figure 1~3 , a testing device for forming limit diagram under the condition of high temperature and constant strain rate, including a sample deformation pressure device, a real-time strain measuring device and a controller;

[0048] The sample deformation pressure device includes a base 11, a workbench 8 fixed on the base 11 through a column 10, a main hydraulic cylinder 13 fixed on the lower end surface of the base 11, and an auxiliary hydraulic cylinder fixed on the upper end surface of the base 11. Cylinder 17, pull rod 14 that is inserted on base 11 and workbench 8 and is slidingly fitted with it, die 26 that is fixedly connected to the upper end of pull rod 14, and the lower end of pull rod 14 is connected with the main piston rod 16 of the main hydraulic cylinder 13 The blank holder 29 provided with the drawbead at the l...

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Abstract

The invention relates to a testing device and a testing method for a forming limit diagram under a high-temperature constant-strain rate condition. The device comprises a sample deformation pressure device, a real-time strain measurement device and a controller; based on a testing method for the forming limit diagram under the high-temperature constant-strain rate condition built by the testing device, the constancy of the strain rate of a sample in a central point is realized under the condition of constant forming temperature, and a forming limit diagram under the obtained slab isothermal condition contains a forming limit curve under a constant-strain rate condition in a certain strain rate range. The testing device and the testing method have the advantages of high control accuracy and accuracy in measurement, and are significant in theoretical research and practical application of light alloys and high-strength steel warm-hot forming.

Description

technical field [0001] The invention relates to a test device for the formability of a metal plate, in particular to a test device and a test method for a forming limit diagram under the condition of high temperature and constant strain rate. Background technique [0002] At present, the world is facing the pressure of energy shortage and environmental pollution. Lightweight is the main trend of automobile development. It is gradually shifting from traditional steel plates to high-strength steels, light alloys and other lightweight materials for automobile body and chassis components to reduce automobile weight. As a result, some emerging sheet forming processes have been born, such as superplastic forming (SPF), rapid plastic forming (QPF), warm stamping (WSF) of aluminum alloy and magnesium alloy sheets, and the development of high-strength steel sheets in recent years. Hot Stamping Forming (HSF), etc. The common feature of these processes is that the sheet is formed in a...

Claims

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Application Information

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IPC IPC(8): G01N3/18
Inventor 管志平管晓芳宋玉泉
Owner JILIN UNIV
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