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Pose estimation-based quick probe calibration device and method

A pose estimation and calibration method technology, applied in the field of testing and measurement, can solve the problems of high cost, bulky, bulky three-coordinate measuring machine, etc., and achieve the effect of low processing cost, convenient portability and rich functions

Inactive Publication Date: 2015-07-29
SHANGHAI UNIV
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Problems solved by technology

However, for every on-site measurement, it may be necessary to disassemble and install different types of measuring rods and probes, and the three-coordinate measuring machine is bulky and heavy, which makes the operation of this visual measurement system convenient and suitable for measurement in complex industrial sites. In addition, this calibration method is expensive

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  • Pose estimation-based quick probe calibration device and method
  • Pose estimation-based quick probe calibration device and method
  • Pose estimation-based quick probe calibration device and method

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Embodiment Construction

[0035] Below in conjunction with accompanying drawing, preferred embodiment of the present invention is described in detail:

[0036] see figure 1 and figure 2 , a rapid calibration device for measuring rods based on pose estimation, comprising a measuring rod 2 with predetermined distribution target points 1, a camera 3, a calibration auxiliary part 4, and a computer 5; the calibration auxiliary part 4 is placed Within the field of view of the camera 3, place the front end of the measuring rod 6 of the measuring rod 2 in a fixed hole on the calibration auxiliary part 4, swing the measuring rod 2 around the fixed hole, and place the i different poses, among which i ≥3 natural numbers, while the camera 3 shoots the measuring stick 2 under the current pose, the camera 3 is connected to the computer 5, and the image collected is used on the computer 5 to obtain the pose parameters under each pose by means of image processing, The precise three-dimensional coordinates of the c...

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Abstract

The invention relates to a pose estimation-based quick probe calibration device and method. The device comprises a probe with established distribution objective targets, a camera, a calibration accessory and a computer. The pose estimation-based quick probe calibration method comprises the following steps: the calibration accessory is placed within a camera viewing field range; the front end of a measuring head of the probe is placed in a fixed hole in the calibration accessory; the probe is swung along the fixed hole to enable the probe to be in n different poses, wherein n is a natural number greater than or equal to 3; meanwhile, the camera is used to shoot current poses of the probe, wherein the camera is connected with the computer; the collected images are utilized to obtain pose parameters of different poses on the computer through an image processing method, and accurate three-dimensional coordinates of center points of all of the objective targets in a right-handed coordinate system in which the measuring head center of the probe is used as an original point are calculated through related algorithms. The device and the method provided by the invention lay the foundation of the precision guarantee of a non-contact optical measurement system.

Description

technical field [0001] The invention relates to a fast calibration device and method for a measuring stick based on pose estimation, belonging to the field of measurement and testing. Background technique [0002] In recent years, with the development of science and technology and the continuous introduction of various advanced manufacturing technology ideas and theories, especially the rapid development of advanced technology with digital manufacturing as the core, the application of computer-aided inspection and computer-aided quality has become more extensive. Visual measurement based on computer vision is a new space three-dimensional coordinate measurement technology developed on the basis of three-dimensional coordinate measurement technology. It adopts a high-resolution, wide-angle camera and high-resolution digital images of the tested part, and uses a high-performance computer to obtain the three-dimensional coordinates of the tested part through image processing an...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01C25/00G01B11/00
CPCG01B11/002G01B11/00G01B11/24G01C25/00
Inventor 张旭程伟郑泽龙
Owner SHANGHAI UNIV
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