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LED automatic life testing device and method

A technology of life testing and driving devices, which is applied in the field of LED automatic life testing devices, can solve the problems that the life test results are easily affected by various factors, the stability of the calibration sheet and the test temperature are high, the aging of the LED chip and the testing process are cumbersome, etc. problems, to avoid excessive frequency of use, to correct the operation process quickly, and to reduce the number of tests

Active Publication Date: 2019-01-18
CHANGZHI CITY HUAJIE GUANG TECH CO LTD
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

This method has high requirements on the stability of the calibration sheet and the test temperature, the life test results are easily affected by various factors, and the aging and testing process of the LED chip is cumbersome.

Method used

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  • LED automatic life testing device and method
  • LED automatic life testing device and method

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Embodiment Construction

[0022] like figure 1 As shown, the LED automatic life testing device of the present invention includes a power supply, a test bench, an automatic loading device, a detector, a temperature controller and a data processing module, and the power supply is electrically connected to the test bench and provides a constant voltage for the test bench. The current is used to light up the chip for photoelectric measurement. The test bench is provided with an automatic loading device. The automatic loading device includes a loading table and a driving device, and the loading table passes through the driving device. Move on the test table, and transport the calibration sheet or chip to be tested to the receiving head.

[0023] The test bench is also connected with a thermostat and a detector, the thermostat is provided with a temperature sensor, the thermostat controls the temperature in the test bench through the temperature sensor, and the photoelectric converter is arranged in the dete...

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Abstract

The invention relates to an LED service life automatically testing device and method and belongs to the technical field of LED testing. The LED service life automatically testing device and method can achieve controllability of ageing environment temperature and testing temperature, set an integrated temperature controller, achieve adjustment and monitoring of the environment temperature and the testing temperature and ensure accuracy of LED chip service life testing results. According to the technical scheme, the LED service life automatically testing device comprises a power supply, a testing table, an automatic loading device, a detector, the temperature controller and a data processing module, wherein the power supply is electrically connected with the testing table; the automatic loading device loads a chip to be tested into the testing table; the testing table is connected with the temperature controller and the detector; the output end of the detector is connected with the data processing module. The LED service life automatically testing method comprises that the temperature controller controls the temperature; a correcting sheet corrects the entire device and places in the chip to be tested for testing when the LED service life automatically testing device meets the precision requirements.

Description

technical field [0001] The invention relates to an automatic LED life testing device and method, belonging to the technical field of LED testing. Background technique [0002] LED is called the fourth-generation lighting source or green light source. It has the characteristics of energy saving, environmental protection, and small size. It is widely used in various indications, displays, decorations, backlights, general lighting and urban night scenes. Therefore, its service life Become one of the most important elements for LED manufacturers and users. [0003] The traditional LED chip life test method is: after the LED chip is simply packaged, it is accelerated to aging, and its life is estimated by testing the photoelectric properties. Since the LED chip is very sensitive to thermal expansion and contraction deformation fatigue caused by temperature changes, the accelerated aging process requires strict control of the ambient temperature. The real-time test results of th...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/26G01R31/44
Inventor 段丽娟
Owner CHANGZHI CITY HUAJIE GUANG TECH CO LTD
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