High-efficiency automatic sampling inspection equipment for SMD material tray

A high-efficiency, high-equipment technology, applied in the direction of electrical components, single semiconductor device testing, electrical components, etc., can solve problems such as high cost, low detection efficiency, and increased equipment investment

Active Publication Date: 2015-08-12
HUAZHONG UNIV OF SCI & TECH
View PDF2 Cites 12 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] Although some sampling inspection schemes for SMD trays have been proposed in the prior art, further research shows that there are still many problems to be solved: for example, the detection method is relatively simple, basically one station or a set of equipment can only detect one parameters; and the structure of the overall equipment is often very complex and expensive, which leads to an increase in equipment investment when building a multi-parameter detection line for electronic components, and the de

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • High-efficiency automatic sampling inspection equipment for SMD material tray
  • High-efficiency automatic sampling inspection equipment for SMD material tray
  • High-efficiency automatic sampling inspection equipment for SMD material tray

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0026] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention. In addition, the technical features involved in the various embodiments of the present invention described below can be combined with each other as long as they do not constitute a conflict with each other.

[0027] figure 1 is a schematic diagram of the overall structure of the sampling equipment constructed according to the preferred embodiment of the present invention, figure 2 yes figure 1 Schematic diagram of the internal structure of the sampling equipment. Such as figure 1 and figure 2 As shown in , the sampling inspection equipment mainly includes a tape positioning unit 100, a detecti...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention discloses high-efficiency automatic sampling inspection equipment for SMD material tray, which is characterized in that the sampling inspection equipment comprises a material belt positioning unit, a detecting unit, a pickup unit and a component box; wherein the material belt positioning unit is used for fixing and positioning the material belts with different widths; the components on the material belt are picked through the pickup unit; furthermore the components are transferred to the detecting unit in high precision for realizing quick inspection for component parameters; and afterwards, successively placing the components after inspection into the component box. The high-efficiency automatic sampling inspection equipment can realize quick automatic sampling inspection on rolled SMD material trays, and has advantages of high-efficiency inspection, simple structure, convenient use, etc.

Description

technical field [0001] The invention belongs to the related field of SMD component detection equipment, and more specifically relates to a high-efficiency automatic sampling inspection equipment for SMD trays. Background technique [0002] With the rapid development of the information industry revolution, the demand for electronic components is increasing day by day. Electronic components are the smallest unit of electronic products and the basis of the reliability of the whole machine. With the development of modern science and technology, the complexity of electronic equipment and systems is getting higher and higher, and the number of electronic components required is also increasing. According to the reliability theory, the more components and parts that make up the system, the lower the reliability of the system under the condition that the reliability indicators of the components and parts remain unchanged. [0003] Especially, for electronic components such as Surfac...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): H05K13/08G01R31/26
Inventor 陈建魁蒋博李秀鹏
Owner HUAZHONG UNIV OF SCI & TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap