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Signal anti-interference device in electronic device detection

An anti-interference device and electronic device technology, which is applied in the direction of electronic circuit testing, electrical components, transmission systems, etc., can solve problems such as difficult reference and use

Active Publication Date: 2017-03-15
南通金泰科技有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The circuit components of the device are not fully disclosed, and it is difficult to refer to them in actual tests

Method used

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  • Signal anti-interference device in electronic device detection

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0017] like figure 1 In the system shown, the input signal 2 generated by the Schottky diode 1 is sequentially passed through the series-connected filter DC blocking circuit 11, the envelope demodulation comparison circuit 9, and the FPGA decoding judge 7, so as to judge whether it is good or bad; The filter DC blocking circuit 11 is composed of a bypass resistor Ra4 connected in parallel with a bypass capacitor Ca3 and then connected in series with a main circuit resistor Rb10. The envelope demodulation comparison circuit 9 is composed of a bypass capacitor Cb5 and the main circuit The capacitor Cd6 is formed, and the bypass resistor Rb10 , the bypass capacitor Ca3 , and the bypass capacitor Cb5 have a common common terminal 12 .

[0018] The values ​​of Ca3, Ra4 and Rb10 are 100pf, 1000 ohms and 1000 ohms respectively, and the values ​​of Cb5 and Cd6 are 10pf and 0.1μf respectively.

[0019] According to the communication protocol, during one bit period, the FPGA samples 8 ...

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PUM

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Abstract

The invention discloses an anti-signal-interference device in electronic device detection. Signals generated by an electronic device successively pass a filtering and blocking circuit, an envelope demodulation and comparison circuit and an FPGA decoding determining device which are connected in series to determine whether the electronic device is effective; a bypass resistor Ra is connected with a bypass capacitor Ca in parallel and then with a main path resistor Rb in series to form the filtering and blocking circuit; the envelope demodulation and comparison circuit is composed of a bypass capacitor Cb and a main path capacitor Cd; and the bypass resistor Rb, the bypass capacitor Ca and the bypass capacitor Cb include a common end. The device is good in anti-interference effect, and whether the electronic device is effective can be determined in a highly reliable manner.

Description

technical field [0001] The invention relates to a detection and signal processing device for electronic device signals. Background technique [0002] The performance parameters of electronic devices such as electronic diodes and microelectronic chips need to be tested by professional instruments or circuits, and compared with standard data to judge whether the electronic devices are good or bad. [0003] The invention with the patent application number 2013101898949 discloses a multi-channel interference signal generation device and interference signal generation method, which includes an interference parameter setting device for setting interference signal parameters, an interference signal generator for generating various array analog signals and The signal output device used for the output of multiple interference signals, the interference parameter setting device is connected to the interference signal generator and the signal output device in turn; the interference para...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H04B1/10G01R31/28
Inventor 吴华刘建峰张小丹李承峰
Owner 南通金泰科技有限公司