Deviation Correction Method of Flying Probe Tester

A technology of flying probe testing machine and calibration method, which is applied in the direction of electronic circuit testing, etc., can solve the problems of poor accuracy of flying probe testing, and achieve the effect of fast process, high efficiency, and improved calibration speed

Active Publication Date: 2017-08-25
JOINT STARS TECH
View PDF8 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] For this reason, the technical problem to be solved by the present invention is that the flying probe testing accuracy of the existing flying probe testing machine is relatively poor, and then a method for correcting the deviation of the flying probe testing machine capable of correcting the deviation between the probe and the center of the camera is provided

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Deviation Correction Method of Flying Probe Tester
  • Deviation Correction Method of Flying Probe Tester
  • Deviation Correction Method of Flying Probe Tester

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0031] The positive and negative directions of the X direction mentioned in the present invention, as well as the forward and reverse directions of the Y direction, use the cross target of the camera image as the coordinate axis, and the positive and negative directions of the X axis correspond to the positive and negative directions of the X direction. The positive and negative directions of the Y axis correspond to the positive and negative directions of the Y direction.

[0032] figure 1 In order to apply the test arm of the flying probe testing machine of the deviation correction method of the present invention, the above-mentioned test arm includes a main body 1, a Z-axis guide rail provided on the main body 1, and a probe device 4 movably installed on the Z-axis guide rail. The front end of the probe device 4 is provided with a probe 41 along the Z-axis direction, and a camera 3 is fixed on the underside of the main body, wherein the camera lens 31 is arranged along the ...

Embodiment 2

[0044] This embodiment adds the following process on the basis of step (4) of embodiment 1: after the control system compensates the above-mentioned actual deviation value, the center of the cross target of the camera image is aligned with the center of another test point of the PCB board to be calibrated o , the area of ​​the test point is smaller than the area of ​​the test point in step (1), repeat step (2) and step (3), and obtain a more accurate actual offset after detecting the center o of the test point through a smaller step size After the control system compensates the above actual offset again, the test is carried out. By adding the above steps, the error can be further reduced to a minimum value, ensuring that the alignment point of the camera is highly coincident with the actual needle insertion point of the probe, and the test accuracy is ensured.

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention discloses a deviation correction method of a flying probe testing machine. First, the center of the cross target of the camera image is aligned with the center o of one of the test points of the PCB board to be calibrated; and then the probe is controlled to detect the PCB board to be calibrated to obtain Probe test point t, with the probe test point t as the initial point, control the probe to find the edge point a1 and edge point a2 on both sides along the X or Y direction, according to the detected two edge points in the X or Y direction Find the center point a3 in the X or Y direction; find the center point in the Y or X direction in the same way, that is, the center o of the test point of the PCB board to be calibrated, between the initial point t of the probe and the center o of the test point The deviation is the actual offset between the probe and the camera center; the test is performed after the control system compensates for the above actual offset. The actual offset between the probe and the center of the camera can be measured before using the flying probe testing machine through the above deviation correction method, which ensures the testing accuracy of the flying probe testing machine.

Description

technical field [0001] The invention belongs to the control field of flying probe testing machines, in particular to a deviation correction method of flying probe testing machines. Background technique [0002] Flying probe testing machine is an instrument for testing PCB boards (printed circuit boards) with high density of component layout, many layers, high wiring density and small distance between measuring points. It mainly tests the insulation and conduction value of circuit boards. The tester generally adopts the "true value comparison positioning method", which can monitor the test process and fault points in real time to ensure the accuracy of the test. The flying probe testing machine has the characteristics of fine pitch, not limited by the grid, flexible testing, and fast speed. [0003] Such as figure 1 As shown, the test arm of the flying probe testing machine is installed on the Y-axis slider of the machine base, and can move up and down in the Y direction. T...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/28
Inventor 黄韬
Owner JOINT STARS TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap