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A temperature control method and system for a semiconductor device

A temperature control method and technology of a temperature control system, applied in the directions of temperature control, control/regulation system, non-electric variable control, etc., can solve problems such as semiconductor device performance degradation, reduce power consumption, prevent excessive temperature, and reduce impact Effect

Active Publication Date: 2017-03-01
FUZHOU ROCKCHIP SEMICON
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

But this will greatly reduce the performance of semiconductor devices

Method used

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  • A temperature control method and system for a semiconductor device
  • A temperature control method and system for a semiconductor device
  • A temperature control method and system for a semiconductor device

Examples

Experimental program
Comparison scheme
Effect test

specific Embodiment 1

[0036] Please refer to figure 1 and image 3 As shown, taking the SOC chip as an example, the SOC chip contains a CPU function module, first test the relationship between the load of the CPU function module of the SOC chip and the maximum operating frequency limit, and according to the load of the CPU function module of the SOC chip tested The relationship with the maximum operating frequency limit, the load of the CPU function module is divided into N (in this embodiment, N takes a value of 4) regions Dn (D1-D4), and each region Dn is set with a corresponding maximum operating frequency limit Fn (F1-F4), see Table 1 for details.

[0037] Table 1 The relationship between the load of the CPU function module and the maximum operating frequency limit

[0038]

[0039] Shown with reference to table 1, described method comprises:

[0040] Step 1. Detect the load L of the CPU function module; for example, the detected load L of the CPU function module falls in the second area ...

specific Embodiment 2

[0056] Please refer to figure 2 and image 3 As shown, taking the SOC chip as an example, the SOC chip contains a CPU function module, first test the relationship between the load of the CPU function module of the SOC chip and the maximum operating frequency limit, and according to the load of the CPU function module of the SOC chip tested The relationship with the maximum operating frequency limit, the load of the CPU function module is divided into N (in this embodiment, N takes a value of 4) regions Dn (D1-D4), and each region Dn is set with a corresponding maximum operating frequency limit Fn (F1-F4), see Table 2 for details.

[0057] Table 2 The relationship between the load of the CPU function module and the maximum operating frequency limit

[0058]

[0059] Shown with reference to table 2, described system comprises:

[0060] The load detection module is used to detect the load L of the CPU function module; for example, the detected load L of the CPU function mo...

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Abstract

The invention provides a temperature control method of a semiconductor device and a temperature control system of the semiconductor device. The method comprises: a step 1, detecting a load of a function module of the semiconductor device, and a step 2, according to a result of the load of the function module, dynamically adjusting the maximum operating frequency limit of the function module of the semiconductor device. The invention further provides the system corresponding to the method. Temperature of the function module of the semiconductor device can be effectively controlled, temperature of the semiconductor device is prevented from being too high, and then user experience is prevented from being influenced; and power consumption can also be reduced, and performance of the semiconductor device is maximized to the greatest extent.

Description

technical field [0001] The invention relates to the field of device temperature control, in particular to a temperature control method for semiconductor devices. Background technique [0002] The operating power consumption of semiconductor devices is mainly affected by operating frequency, voltage, and load. Generally, the higher the operating frequency, the higher the performance, but the higher the required operating voltage, the greater the operating power consumption. Under the same operating frequency and operating voltage, the greater the load, the greater the operating power consumption. With the increase of operating power consumption, the temperature of the semiconductor device will rise, and the temperature rise will change the characteristics of the semiconductor device, which may make it unable to work normally and bring a bad user experience. [0003] In many semiconductor devices, there may not be a temperature detection module, and the temperature cannot be...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G05D23/20
Inventor 黄涛
Owner FUZHOU ROCKCHIP SEMICON