Stranded wire sample insulation accelerated aging life experimental method with electromagnetic acting force

Abstract

The invention discloses a stranded wire sample insulation accelerated aging life experimental method with an electromagnetic acting force. An air-gap magnetic field is established between an upper magnetic pole and a lower magnetic pole by taking permanent magnets as a magnetic field source, a stranded wire pair insulation sample is placed on an insulation sample installation plane in the air-gap magnetic field, and a pulse current is applied to conductors of the stranded wire pair insulation sample to generate an electromagnetic acting force. The insulation sample installation plane is positioned on an iron core of the lower magnetic pole, and is an exposed smooth conductive plane. Both ends of the insulation sample installation plane are each provided with an insulation sample conductor lead wire insulation region, a withstand voltage value between the insulation sample conductor lead wire insulation regions and the iron core of the lower magnetic pole is not less than 10kV, and the heat resistance is not less than 250 DEG C. During the stranded wire pair insulation sample accelerated aging accelerated aging life test, a stress factor which is the electromagnetic acting force is added besides an electrical stress and a temperature stress, and the experimental environment is closer to the environmental conditions under which electrical equipment is applied.

Description

technical field [0001] The invention relates to a method for testing the accelerated aging life of an electromagnetic wire twisted pair insulation pulse voltage including an electromagnetic force factor for a variable frequency motor. Background technique [0002] The electrical life of electrical insulation materials and insulation structures of electrical equipment directly affects the life and operation safety of electrical equipment. In order to quickly obtain the electrical life of new insulation structures of electrical equipment, it is necessary to simulate the stress environment of the insulation structure during operation without changing the insulation failure. Under the premise of the mechanism, the insulation aging process can be accelerated by appropriately increasing the stress value of the insulation structure, and the quality and improvement of the insulation structure performance can be confirmed by comparing with the standard sample, or the life model can be...

AI Technical Summary

Problems solved by technology

The currently developed pulse electrical stress insulation accelerated aging test device only includes three stress parameters of pulse voltage amplitude, frequency, and temperature, and is mainly used to study the influence of pulse voltage amplitude, pulse frequency, and temperature stress factors on insulation life. The influence of mechanical stress generated by electromagnetic force on the aging speed of insulation is not considered

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