Inclined projection correction method and system in structured light three-dimensional measurement
A technology of three-dimensional measurement and correction method, which is applied to measurement devices, optical devices, instruments, etc., and can solve problems such as unavoidable projector system errors.
Active Publication Date: 2015-10-21
东莞市盟拓智能科技有限公司
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[0007] The technical problem to be solved by the present invention is to provide a method and system for oblique projection correction in structured light three-dimensional measurement, so as to solve the problem that the correction method in the prior art cannot avoid the systematic error of the projector
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[0035] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments.
[0036] Such as figure 1 As shown, the oblique projection correction method in the structured light three-dimensional measurement proposed by the present invention includes the following steps:
[0037] Step S1: Calculate the distortion from the original image to the projected image according to the original image input to the projector and the projected image obtained by obliquely projecting the original image onto the projection plane by the projector.
[0038] Let the original image be an N matrix, and the projected image obtained by obliquely projecting the original image onto the projection plane is an M matrix. In the original image, let the coordinates of any point in the original image be N(x 0 ,y 0 ), obliquely project the original image...
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The invention relates to the technical field of three-dimensional measurement based on structured light, and especially relates to an inclined projection correction method and system in structured light three-dimensional measurement. The correction method comprises the following steps: according to an original image input to a projector and a projection image obtained when the projector projects the original image to a projection plane, calculating distortion from the original image to the projection image; according to the distortion, calculating a source image needing to be input to the projector for obtaining a target projection image; and inputting the source image into the projector so as to project the target projection image. According to the invention, according to the target projection image a user wants to obtain, then through combination with the calculated distortion from the original image to the projection image obtained by projecting the original image to the projection plane, the source image needing to be input into the projector for obtaining the target projection image is worked out, and accordingly, the standard target projection image is obtained. The correction method only relates to projection correction and prevents influences exerted by system errors of the projector on projection.
Description
technical field [0001] The present invention relates to the technical field of three-dimensional measurement based on structured light, in particular to an oblique projection correction method and system in structured light three-dimensional measurement. Background technique [0002] 3D inspection systems based on structured light are used in a very wide range. For example, the 3D SPI system can detect the height of solder paste, the 3D AOI system can detect the height of components, and the 3D scanning system can quickly and accurately reconstruct the point cloud data of the measured object, etc. [0003] These structured light-based 3D inspection systems all include one or more projection systems that project structured light and one or more imaging systems that capture images. The imaging system captures the image of the object after the structured light is projected, and obtains the height value of the object through a reconstruction algorithm based on the triangular re...
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IPC IPC(8): G01B11/25G01B11/06
Inventor 王冠
Owner 东莞市盟拓智能科技有限公司