Harmonic analysis method

A harmonic analysis and data technology, applied in the field of harmonic analysis, can solve the problems of high cost and low precision, and achieve the effect of increasing sampling data, improving data processing accuracy, and increasing sampling frequency

Active Publication Date: 2015-11-11
青岛艾诺仪器有限公司
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AI Technical Summary

Problems solved by technology

[0004] In order to solve the problem that the existing harmonic analysis mainly depends on improving the hardware performance to increase the AD sampling frequency, resulting in high cost and reduced precision, the present invention proposes a Harmonic analysis method, AD sampling breaks away from hardware requirements, reduces cost and improves sampling accuracy

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Embodiment 1

[0021] Embodiment one, this embodiment proposes A Harmonic Analysis Method , including the following steps:

[0022] S1. Continuously sampling the electrical signal with period T at a fixed frequency f0, the sampling time is M, and M is not less than 2T, and an original sampling array S is obtained, wherein the original sampling array S includes data of M / T periods;

[0023] S2. Interpolating the values ​​in the original sampling array S into the same period T to obtain an array Sc;

[0024] S3. Find out the sampling values ​​at the time closest to all sampling time points of the FFT from the array Sc to obtain the array St;

[0025] S4. Calculate the St test result by using FFT fast Fourier transform to obtain harmonic data.

[0026] Wherein, in the step S1, a conventional ADC sampler is used for sampling, and the sampling frequency does not need to be too high, so the complexity of the system is correspondingly low, and the reliability of the sampling will not be reduced. ...

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Abstract

The invention discloses a harmonic analysis method. The harmonic analysis method comprises the steps that (1) continuous sampling is carried out on electrical signals with the period of T at fixed frequency f0 to acquire an original sampling array S, wherein the sampling time is M no less than 2T, and the original sampling array S comprises data of M/T periods; (2) a value in the original sampling array of S is interpolated into the same period T to acquire an array Sc; (3) a sampling value with the time closest to all FFT sampling time points is found out from the array Sc to acquire an array St; and (4) FFT fast Fourier transforming is used to calculate an St test result to acquire harmonic data. According to the harmonic analysis method provided by the invention, ADC frequency is not required, so that hardware cost is not increased; by adjusting the continuous sampling time of the electrical signals with the period of T, high-density sampling data can be acquired; the sampling effect same as improving sampling frequency is acquired; the sampling data are improved; and the data processing accuracy is accordingly improved.

Description

technical field [0001] The invention relates to a harmonic analysis method. Background technique [0002] In the application fields of harmonic testing and spectrum analysis of power analyzers, harmonic analysis technology is often used. Sub-harmonic components to understand the distortion of the signal. When performing spectrum analysis on a periodic electrical signal, the signal is usually sampled by a digital ADC first, and then processed by FFT or DFT (Discrete Fourier Transform). When FFT is used for data processing, it is usually necessary to The sampling frequency of the ADC is associated with the frequency of the electrical signal. For example, when performing FFT analysis on a 500Hz signal, an ADC sampling frequency of 512KHz can be used to ensure test accuracy. When the frequency of the electrical signal is 5KHz, the sampling frequency of the ADC is required. At least 5.12MHz, which will greatly increase the cost of the circuit. [0003] At present, the harmonic...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R23/16
Inventor 彭文敏黄秉铭
Owner 青岛艾诺仪器有限公司
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