Expanded OVP and short circuit test circuit and test method

Abstract

The invention relates to the field of electronic equipment for measurements and tests, and discloses an expanded OVP and short circuit test circuit and a test method. The expanded OVP test circuit includes a built-in test loop and an external test loop. Device connection channels of the built-in test loop are connected to switch device control ends on device connection channels of the external test loop respectively. An overvoltage source connection channel of the built-in test loop is connected to a switch device control end on an overvoltage source connection channel of the external test loop. The expanded OVP test circuit can be applied to both low-power test occasions and large-power test occasions, the same control logic is utilized, an expansion function can be achieved only when a wiring mode is changed and a corresponding external module is additionally adopted, and extra control management is not needed.

Description

technical field [0001] The invention relates to the field of electronic equipment for measurement and testing, in particular to an extended OVP testing circuit and testing method. Background technique [0002] In the automatic test system, relays are usually used for short-circuit test or OVP test, but there are many types of relays, and using high-power relays to switch low-power circuits cannot be economical and cannot guarantee its accuracy. If a high-power relay is used to switch a high-power circuit, there is a risk of being easily damaged or impossible at all. If multiple systems are used to switch, although the accuracy can be guaranteed, each control circuit requires a control system, which cannot be built into the Inside the instrument, it is more difficult to manage. Contents of the invention [0003] Aiming at the shortcomings of the existing technology, the present invention proposes an expandable switching scheme for OVP test occasions, which can realize curr...

AI Technical Summary

Problems solved by technology

[0002] In the automatic test system, relays are usually used for short-circuit test or OVP test, but there are many types of relays, and using high-power relays to switch low-power circuits cannot be economical and cannot guarantee its accuracy. If a high-power relay is used to switch a high-power circuit, there is a risk of being easily damaged or impossible at all. If multiple systems are used to switch, although the accuracy can be guaranteed, each control circuit requires a control system, which cannot be built into the Inside the instrument, it is more difficult to manage

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