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Measuring device and measuring method for high resolution time synchronization in OFDM systems

A technology of measurement equipment and measurement methods, which is applied in transmission systems, multi-frequency code systems, digital transmission systems, etc., can solve problems such as low synchronization accuracy and a large amount of computing power, and achieve the effect of simple and accurate calculation and improved accuracy

Active Publication Date: 2015-12-09
ROHDE & SCHWARZ GMBH & CO KG
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  • Application Information

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Problems solved by technology

But this method requires a lot of computing power and is in principle limited to an accuracy no greater than the distance between two sampling points
[0003] For example, international patent application WO2008 / 116534A1 discloses a method and system for determining the channel impulse response in an OFDM transmission system, including determining the timing of OFDM symbols using the system and method shown therein, only relatively low synchronization accuracy can be achieved

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  • Measuring device and measuring method for high resolution time synchronization in OFDM systems
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  • Measuring device and measuring method for high resolution time synchronization in OFDM systems

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Embodiment Construction

[0022] First, we base Figure 1-Figure 3 To illustrate the underlying problems and general principles of the invention. according to Figure 4-Figure 6 , shows the structure and function of an embodiment of the measuring device of the present invention. Finally, according to Figure 7 , showing the functionality of an embodiment of the measuring method of the invention.

[0023] Similar entities and reference numerals in different drawings have been partially omitted.

[0024] The present invention is configured to work with communication standards using known pilot symbols (eg OFDM). From the output of the OFDM modulator at the transmitter to the input of the OFDM demodulator at the receiver, we process I / Q samples in the time domain, while we process I / Q samples in the frequency domain in other processing stages.

[0025] The relationship between the I / Q samples in the time domain x(n) and the I / Q samples in the frequency domain X(k) is given by the discrete Fourier tra...

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Abstract

A measuring device for measuring a symbol start time in a first signal of a device under test comprises reception means for receiving the first signal and processing means for processing the first signal. The processing means comprise synchronization calculation means (32) for calculating the symbol start time comprising channel estimation means (40) for estimating channel response parameters, phase means (41) for calculating phase values from the channel response parameters, differentiating means (42) for performing a differentiation of the phase values, and calculation means (44) for calculating the symbol start time from the differentiated phase values.

Description

technical field [0001] The present invention relates to a measuring device and a measuring method for accurately measuring symbol start times in a signal of a device under test. Background technique [0002] In conventional OFDM receivers, time synchronization is usually achieved by correlation of known pilot symbols and received pilot symbols. However, this method requires a lot of computing power and is in principle limited to an accuracy not exceeding the distance between two sampling points. [0003] For example, international patent application WO2008 / 116534A1 discloses a method and system for determining the channel impulse response in an OFDM transmission system, including determining the timing of OFDM symbols using the system and method shown therein, only relatively low synchronization accuracy can be achieved . Contents of the invention [0004] It is therefore an object of the present invention to create a measuring device and a measuring method for accuratel...

Claims

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Application Information

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IPC IPC(8): H04L27/26
CPCH04L27/2665H04L27/2672H04L27/2695
Inventor 斯蒂芬·施密特
Owner ROHDE & SCHWARZ GMBH & CO KG