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On-line measurement apparatus and method of thickness of non-contact object

A non-contact, measuring device technology, applied in the direction of measuring devices, optical devices, instruments, etc., can solve the problems of slow speed, affecting accuracy, and low time-consuming efficiency, and achieve error reduction, high stability, and simple operation Effect

Active Publication Date: 2015-12-16
江苏云扬仪器设备有限公司
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] Contact measurement is easy to operate, but there are also obvious defects, such as: 1. Frequent contact between the probe and the surface during the measurement process may damage the original surface finish, and may also cause the probe to wear and affect the accuracy
2. Generally speaking, the speed of contact measurement is relatively slow, which is not suitable for collecting a large number of data
Among the non-contact detection methods, there are laser triangulation, ultrasonic thickness measurement, interferometry, etc. Among them, the accuracy of laser triangulation is generally about 3 μm, which cannot meet the requirements for some relatively high-precision measurements, while interferometry is more susceptible to Influenced by external factors, the stability is not very good
[0005] Nowadays, many flat sheets or flat glass have thickness requirements when making them, so each batch of products needs to be screened, which is time-consuming and inefficient if done manually

Method used

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  • On-line measurement apparatus and method of thickness of non-contact object
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  • On-line measurement apparatus and method of thickness of non-contact object

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Embodiment Construction

[0028] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the drawings in the embodiments of the present invention.

[0029] Embodiments of the present invention are described in detail below, examples of which are shown in the drawings, wherein the same or similar reference numerals designate the same or similar elements or elements having the same or similar functions throughout. The embodiments described below by referring to the figures are exemplary only for explaining the present invention and should not be construed as limiting the present invention.

[0030] The object of the present invention is to provide a non-contact online measuring device for object thickness. The device enters the measuring range of the probe through the transmission belt, and the light emitted by the light source is coupled into the optical probe. Then, using the confocal principle, the probe 2 can receive the...

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Abstract

The invention provides an on-line measurement apparatus and method of thickness of a non-contact object. The apparatus comprises a light source, an optical fiber, an optical probe A, an optical probe B, a one-dimensional moving platform support, a transmission belt, a roller, a to-be-measured objet, a one-dimensional moving platform, a spectrograph, a data line, and a computer. The object is conveyed into a measurement range of the probes by the transmission belt; and light emitted by the light source enters the optical probes by coupling. On the basis of a confocal principle, the optical probe A can receive light reflected back by the upper surface of the object and the optical probe B can receive light reflected back by the lower surface; the data are fed back to the computer to obtain the thickness of the object; the computer determines the object thickness; and when the condition is met, no prompting is carried out; and when a set range is exceeded, the computer provides alarming information that the object does not meet the standard. The apparatus with a simple structure can be operated conveniently; the measurement precision is high; and the apparatus can be applied to large-scale flow line production and thus has the great practical value.

Description

technical field [0001] The invention relates to the field of non-contact detection, in particular to an object thickness detection device and method. Background technique [0002] Contact measurement and non-contact measurement are two existing measurement methods. [0003] Contact measurement is easy to operate, but there are also obvious defects, such as: 1. Frequent contact between the probe and the surface during the measurement process may damage the original surface finish, and may also cause the probe to wear and affect the accuracy. 2. Generally speaking, the speed of contact measurement is relatively slow, which is not suitable for collecting a large amount of data. At the same time, it is also easily affected by the operation and temperature of the measuring personnel, and the efficiency is low and the stability is not high. [0004] In contrast, non-contact measurement technology has developed rapidly in recent years due to its advantages of fast, accurate, and ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/06
Inventor 姚红兵李丽淋倪文强王单单陈明明
Owner 江苏云扬仪器设备有限公司