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LCD bare chip detection unit framework and detection method

A detection unit and detection method technology, which is applied in the direction of optical testing defects/defects, can solve the problems of increased test time and unstable camera pictures, and achieve the effects of stabilizing the test environment, reducing color and light interference, and improving test accuracy and efficiency

Inactive Publication Date: 2016-02-03
苏州威盛视信息科技有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0002] Due to the very small defects of the LCD bare chip inspection, the stability of the whole machine is very high. The screen switching process in the current test generally has a mechanism action, which will cause the camera picture of the whole machine to be unstable and require additional vibration time. Overall test time increased
At the same time, since the backlight source is white light, the LCD monochrome test screen will be affected by other color lights to test the accuracy of the equipment

Method used

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  • LCD bare chip detection unit framework and detection method
  • LCD bare chip detection unit framework and detection method

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Experimental program
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Effect test

Embodiment 1

[0028] A kind of LCD bare chip detection unit framework, comprises the following device composition: a bare chip stage 2, is used to place the bare chip 3 for testing; A light source 1, is arranged under described bare chip stage, is used for illuminating described bare a chip; a camera 6, used to acquire the image of the die, and send the image to the control unit; a signal unit 5, connected to the die carrier through the connection line 4, and controlled by the control unit; a control unit 7, generally a computer , connected to the light source, camera, and signal unit, capable of controlling the light source to emit corresponding lighting, controlling the operation of the camera and receiving the image sent by it, and controlling the signal unit and receiving the response signal sent by it. The light source 1 is a backlight light source with RGB three colors that can be controlled separately.

[0029] Detection method of the present invention is as follows:

[0030] S1: Th...

Embodiment 2

[0049] The difference from Embodiment 1 is that a side light source 8 is placed on one side of the die carrier 2 , and the side light source 8 is connected to and controlled by the control unit 7 .

[0050] The detection method is different in that after step S4, the light source is switched to the side light source, the camera captures the corresponding image, the calculation control unit analyzes the surface foreign matter information of the die, and the calculation control unit calculates the surface foreign matter in the corresponding position. defects are eliminated.

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Abstract

The invention relates to an LCD bare chip detection unit framework and a detection method. The LCD bare chip detection unit framework comprises a bare chip carrying table, a light source, a camera, a signal unit and a control unit. The bare chip carrying table is used for containing a bare chip for testing. The light source is arranged below the bare chip carrying table and used for lighting the bare chip. The camera is used for acquiring images of the bare chip and sending the images to the control unit. The signal unit is connected with the bare chip carrying table through a connecting wire and controlled by the control unit. The control unit is usually a computer, is connected with the light source, the camera and the signal unit, can control the light source to send corresponding lighting, can control operation of the camera and receive the image sent by the camera, and can control the signal unit and receive response signals sent by the signal unit. Through the RGB three-color controllable backlight source, colorama lighting with testing signal image corresponding requirements is provided, colorama interference of a common testing light source is reduced, meanwhile, due to the fact that testing signals and testing modes are switched without any mechanism motion, a stable testing environment is provided, and testing accuracy and efficiency are improved.

Description

technical field [0001] The invention relates to an LCD bare chip detection unit structure and a detection method. Background technique [0002] Due to the very small defects of the LCD bare chip inspection, the stability of the whole machine is very high. Currently, the screen switching process in the test generally has a mechanism action, which will cause the camera picture of the whole machine to be unstable and require additional vibration time. Overall test time increased. At the same time, since the backlight source is white light, the LCD monochrome test screen will be affected by other color lights to test the accuracy of the equipment. [0003] In view of the above-mentioned defects, the designer is actively researching and innovating, in order to create a structure and method of LCD bare chip detection unit, so that it has more industrial application value. Contents of the invention [0004] In order to solve the above technical problems, the object of the prese...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/95
Inventor 张智海易永祥
Owner 苏州威盛视信息科技有限公司
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