Lens-free particle microscopic localization device and method based on LED light sources

Abstract

The invention discloses a lens-free particle microscopic localization device and method based on LED light sources. The lens-free particle microscopic localization device comprises the LED light sources, a sample arranging cell and a CMOS (complementary metal oxide semiconductor) or CCD (charge coupled device) camera sensor, wherein the more than two LED light sources are arranged in different positions above the sample arranging cell to irradiate a sample from different angles; the sample arranging cell is arranged above the camera sensor, the distance between the lower surface of the sample arranging cell and the camera sensor is as small as possible, and the sample arranging cell and the camera sensor keep parallel to guarantee the quality of interference images. The device is simple in structure, rapid, accurate, concise, efficient and low in cost; extraction and reduction of particle location and dimension information are realized with numerical propagation and decision methods, multi-particle information is recorded in real time, and particle tracking is realized.

Description

technical field [0001] The invention belongs to optical measurement and imaging technology, in particular to a lensless particle micro-positioning device and method based on a three-color LED light source. Background technique [0002] Particle micropositioning is an important technology for optical measurement and imaging. No matter in the field of biomedicine or detection, particle micropositioning technology is playing an important role. Throughout nearly half a century of progress in the field of optical measurement technology, the most classic three-dimensional structure imaging technology is tomography technology, but this technology still has its shortcomings in the application of particle localization: firstly, it is necessary to rotate the illumination or the sample to achieve a certain One layer of planar data, while the mechanical scanning device will inevitably lead to lower time efficiency, and lacks real-time performance for particle positioning. There is also...

AI Technical Summary

Problems solved by technology

Throughout nearly half a century of progress in the field of optical measurement technology, the most classic three-dimensional structure imaging technology is tomography technology, but this technology still has its shortcomings in the application of particle localization: firstly, it is necessary to rotate the illumination or the sample to achieve a certain One layer of planar data, while the mechanical scanning device will inevitably lead to lower time efficiency, lack of real-time performance for particle positioning

Traditional holographic imaging equipment mostly uses laser light sources, and the speckle noise introduced thereby limits the improvement of its imaging positioning accuracy ([2]DaintyJC. ,9.)

At the same time, complex light source equipment will bring great inconvenience to the flexibility of the device

In the traditional holographic interferometry, because of the problem of the conjugate image, the particles located in the same plane position but with different axial positions are easy to interact with each other, so the traditional holographic interferometry must use off-axis measurement to eliminate the conjugate image ( [3] CucheE, MarquetP, DepeursingeC.Spatialfilteringforzero-orderandtwin-imageeliminationindigitaloff-axisholography[J].Appliedoptics,2000,39(23):4070-4075.)

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