30 results about "Holographic interferometry" patented technology

A system and method for recording and reproducing holographic interferogram with servos. A servo process is provided by the system and method to continuously record a holographic interferogram in a holographic recording medium with servo trace layers. Also, by the servo process, the intensity distribution of a reference beam is monitored, which is reflected by a reflecting mirror disposed on the other side of the holographic recording medium. By analyzing the distribution, one can adjust the distance and the incidence angle between the reflection mirror and the reference beam. Moreover, a plurality of servo tracks on different layers are provided for recording the holographic interferogram on different layers of holographic recording medium.

The invention relates to a preparation method of a sub-micron-sized two-dimensional dielectric cylindrical photonic crystal, and the preparation method comprises: depositing Si3N4 by plasma-enhanced chemical vapor deposition (PECVD), carrying out spin coating, soft baking and vertical crossover exposure, baking after exposure, developing step by step, etching Si3N4 by reactive ion etching (RIE), removing the photoresist, etching the substrate material by inductively coupled plasma etching (ICP) and removing Si3N4. Through the preparation method, the problem that the two-dimensional dielectric cylindrical photonic crystal is difficult to prepare by using a positive photoresist in holographic interferometry is solved. Compared with electron beam exposure and other methods, the preparation method has the advantages of simplicity in operation, low price, precise control, large-area preparation and the like, meets the need of the preparation of the sub-micron-sized two-dimensional dielectric cylindrical photonic crystal and has good application prospects.

The invention discloses a fabrication method of a holographic speckle structured organic light emitting diode. The fabrication method comprises the following steps of firstly, fabricating image surface holographic interference fringes of a speckle on photoresist by a holographic photoetching technique; secondly, sequentially fabricating a first electrode layer, an organic layer and a back electrode on the image surface holographic interference fringes; and finally, packaging to fabricate the holographic speckle structured organic light emitting diode. Directional light emergent enhancement of the organic light emitting diode can be controlled by adjusting an angle of holographic interference recording reference light to acquire the effect of directionally improving luminous efficiency, and moreover, the phenomena of spectrum drift and leakage current increase are prevented.

The present invention is connected with the holographic interferometry method and device that provides, to a very high precision, the reconstructing the original waveform of light emitted or reflected by an object. This method allows image resolution close to that of the wavelength of the light being used. The non-destructive method of holographic interferometry coupled with impulse heating of the test article to allow observation of its dynamic response to operating conditions, as described herein, is one of the most effective non-contact automated quality control methods available.

The invention relates to a method for measuring a liquid phase diffusion coefficient, and an apparatus thereof, and belongs to a method for measuring a diffusion coefficient of a liquid by adopting yellow light LED as a light source based on a capillary imaging method. According to the present invention, a transparent capillary is adopted to construct a liquid phase diffusion cell; the specific refractive index spatial resolution measurement capability of the capillary imaging method is adopted to directly observe and record the diffusion regularity of the thin layers of the diffusion medium in the capability, wherein the thin layers of the diffusion medium have the same refractive index; the liquid phase diffusion coefficient is calculated based on the Fick second law. With the present invention, the diffusion coefficient between glycerol and purified water is measured at a room temperature of 25 DEG C, with comparing the diffusion coefficient 0.720*10<-5> cm<2> / s reported by the literature of the traditional holographic interferometry method with the diffusion coefficient 0.715*10<-5> cm<2> / s measured by the method of the present invention, the relative error is 0.69%; the capillary is adopted to construct the liquid phase diffusion cell, such that the amount of the required sample is less, the measurement speed is rapid, the anti-interference capability is strong and the system stability is good.

The invention relates to a refractive index two-dimensional distribution dynamic measurement method, which combines a digital holographic interferometry and total internal reflection. Phase shift magnitude of reflected light in a total internal reflection process is relative to an incident angle of the incident light and refractive index of mediums at two sides of a total internal reflection prism interface, a double-exposure digital holographic interferometry is used for dynamic measurement of a phase shift difference value of reflected light before and after a sample to-be-detected is placed on a total internal reflection hypotenuse surface, and the two-dimensional refractive index dynamic distribution of the sample can be calculated directly according to a relation of the reflected light phase shift difference value and the refractive index of air and the sample. The method is characterized in that the refractive index of the sample can ensure that incident light generates total internal reflection in the total internal reflection prism interface, so that large scope refractive index distribution measurement can be realized.

The single beam rainbow hologram recording equipment contains light source, rainbow plate, imaging lens, holographic recording plate and control device, the light source can be laser or other monochromatic light source, and rainbow plate is placed in the imaging position of shot body by means of imaging lens, the film of holographic recording plate is closed to the rainbow plate, the shot body, imaging lens, rainbow plate and holographic recording plate are positioned on same optical axis. It can be used for shooting hologram, after imaged, through exposure and chemical treatment, a white light reproduced rainbow hologram can be obtained. Said equipment is compact in structure, simple and convenient in operation, and possesses extensive application in the holographic interferometric research of nondestructive test, stress and strain analysis and photoelastics.

The invention proposes a system and a method for measuring aspheric interference based on reference surface of a spatial light modulator, relating to an interferometry system and an interferometry method for measuring the aspheric surface shape and belonging to the field of photoelectric detection. The measuring system of the invention comprises a laser, a collimating objective, a spectroscope, a reference lens, a compensator, a to-be-measured aspheric surface, an imaging objective and a CCD detector. The SLM is used as the reference lens for an aspheric interferometry system, defined as an SLM reference lens. The present invention also discloses a measuring method using an aspheric interferometry system. The technical problem to be solved in the present invention is to generate a non-planar wavefront equal to a partially compensated aspheric wavefront and achieves zero-interference measurement. While the system and the method inherit the advantages of the partially compensating method that requires lower precision on the designing and manufacturing of the compensator, the advantage of high accuracy of the zero-compensation interferometry method is also maintained. In addition, it is possible to avoid the introduction of mechanical phase shift error in a traditional interferometry system.

The single beam rainbow hologram recording equipment contains light source, rainbow plate, imaging lens, holographic recording plate and control device, the light source can be laser or other monochromatic light source, and rainbow plate is placed in the imaging position of shot body by means of imaging lens, the film of holographic recording plate is closed to the rainbow plate, the shot body, imaging lens, rainbow plate and holographic recording plate are positioned on same optical axis. It can be used for shooting hologram, after imaged, through exposure and chemical treatment, a white light reproduced rainbow hologram can be obtained. Said equipment is compact in structure, simple and convenient in operation, and possesses extensive application in the holographic interferometric research of nondestructive test, stress and strain analysis and photoelastics.

A multifunctional holographic interferometry system of the invention comprises a vibration absorbing platform, a focusing device, a carrier platform, a measurement optical path module, a lower shell and an upper shell. The focusing device and the carrier platform are arranged in the lower shell. The measurement optical path module is arranged in the upper shell. The lower shell is fixed on the vibration absorbing platform. The vibration absorbing platform adopts a spring damping structure to achieve the purpose of passive vibration absorbing. The focusing device adopts a worm gear screw lifting structure, and is used to realize the up-down movement of the measurement optical path module in the upper shell. The carrier platform is used to place a sample to be measured and realize the horizontal movement of the sample, and includes a bottom coarse adjustment part, a nano piezoelectric fine adjustment part and a leveling part arranged in turn from bottom to top. The measurement optical path module is used to realize reflection measurement and transmission measurement. The system can carry out reflection measurement and transmission measurement simultaneously, has a compact overall optical path structure, and is convenient and efficient.

The invention relates to a calibration method for the rotation axis of a holographic interferometric four-axis measuring device. The error of fitting which is realized by means of the center of a standard ball is large, and as a result, the problem of inaccurate calibration of a rotation axis is brought about, while, with the measuring device of the invention adopted, the problem can be solved. The method is realized by means of a binocular stereoscopic image sensor and a planar target with a standard point. The method includes the following steps that: 1, the images of a planar target in a set of different positions are acquired; 2, a holographic interferometric sensor obtains the three-dimensional point cloud data of the planar target in the set of different positions; 3, the planar fitting of the planar target is carried out; 4, a set of vectors of a fitted plane and the rotation center of the fitted plane are obtained, the calibration value of the rotation axis is determined; 5, arotation matrix R and a translation vector T between two coordinate systems are solved; and 6, and the calibration of the rotation axis is completed in a unified manner in a coordinate system. The calibration method of the invention has high precision and high efficiency.

The invention relates to a digital holography method for detecting the vibration amplitude of an object (15) having a vibration frequency ω, comprising: generating object illumination waves (Wt) and reference waves (WLO); acquiring interferograms between the reference wave (WLO) and a signal wave (Ws) by means of a bandwidth ω s detector (19), the reference wave comprising two components ELO1, ELO1 of frequencies ω1, ω2 that are respectively staggered in relation to the laser frequency ωL by a quantity δ1=γ1ωs and δ2=qω+γ2ωs, where q is an integer and −0.5≦γ1, γ2≦0.5; and calculating the vibration amplitude of the object from the optical beats spectrum deduced from the complex amplitude of an interferogram.

The invention provides a method and a system for generating holographic interference fringes. The method comprises: in the case of a digital image, generating a BMP grayscale bitmap and a BMP color bitmap of the digital image, generating a grayscale masking map by defining the corresponding relation between the angle range of the interference fringes and 256 grayscales, wherein the pixels of the grayscale masking map correspond to the pixels of the BMP grayscale bitmap and the BMP color bitmap one to one, and generating the holographic interference fringes of the digital image by using the BMP grayscale bitmap, the BMP color bitmap and the grayscale masking map. The method defines the corresponding relation between the angle range of the interference fringes and 256 grayscales so that the angle change of the interference fringes in the range of the interference fringes is much finer and subtler, thereby achieving a remarkable texture effect of a stereoscopic relievo.

Systems and methods for direct-to-digital holography are described. An apparatus includes a laser; a beamsplitter optically coupled to the laser; a reference beam mirror optically coupled to the beamsplitter; an object optically coupled to the beamsplitter, a focusing lens optically coupled to both the reference beam mirror and the object; and a digital recorder optically coupled to the focusing lens. A reference beam is incident upon the reference beam mirror at a non-normal angle, and the reference beam and an object beam are focused by the focusing lens at a focal plane of the digital recorder to form an image. The systems and methods provide advantages in that computer assisted holographic measurements can be made.

The invention relates to a preparation method of a sub-micron-sized two-dimensional dielectric cylindrical photonic crystal, and the preparation method comprises: depositing Si3N4 by plasma-enhanced chemical vapor deposition (PECVD), carrying out spin coating, soft baking and vertical crossover exposure, baking after exposure, developing step by step, etching Si3N4 by reactive ion etching (RIE), removing the photoresist, etching the substrate material by inductively coupled plasma etching (ICP) and removing Si3N4. Through the preparation method, the problem that the two-dimensional dielectric cylindrical photonic crystal is difficult to prepare by using a positive photoresist in holographic interferometry is solved. Compared with electron beam exposure and other methods, the preparation method has the advantages of simplicity in operation, low price, precise control, large-area preparation and the like, meets the need of the preparation of the sub-micron-sized two-dimensional dielectric cylindrical photonic crystal and has good application prospects.

The invention relates to a device and method for detecting the topological charge number of vortex beams based on an improved Mach-Zehnder interferometer, and belongs to the technical field of digital holography. The device comprises a semiconductor laser unit, a microscope objective spatial fiber, a collimating lens, a beam splitter prism I, a plane mirror, a beam splitter prism II, a spatial light modulator, a beam splitter prism III, a beam splitter prism IV and a photoelectric coupled device. According to the method, one arm of the device is used for generating the vortex beams to be used as object light, the other arm of the device is used for generating the vortex beams to be used as reference light, the holographic interferometry principle is used for recording the wave front phase information of the vortex beams in an interference fringe mode, phase distribution is digitally reconstructed in the later period, and the topological charge number of the vortex beams can be obtained according to the reconstructed phase distribution in accordance with the definition of the vortex beams. The device and method solve the problem that at present, specific instruments or equipment is needed in the method for detecting the topological charge number of the vortex beams, or an existing detecting method is complex to operate, poor in stability and low in reliability.

The invention discloses a measuring method of material electrostrictive strain and distribution thereof based on digital holographic interferometry. The method comprises steps: applying an electric field on a tested material, recording digital holograms in different electric fields, performing numerical reconstruction, to obtain phase distribution; using a digital holographic interference technology, to obtain phase difference distribution under different states, through strain relations, calculating to obtain strain and distribution of materials; plotting points of corresponding strain values in different electric field to draw, to obtain an electrostrictive strain curve of the material, so as to obtain an inverse piezoelectric coefficient of the material. Compared with the prior art, a non-contact measuring method is used, and the method is characterized by simple principle, convenient measuring, low cost, high precision, and good practicality, and can dynamically measure strain distribution of a whole material surface in real time.

The invention discloses a digital holography interference and variable frequency projection stripe duplex measurement system and method and belongs to the technical field of photoelectric measurement. The system comprises a set of continuous variable angle digital holography interference measuring device or a variable wave length digital holography interference measuring device and a set of multi-step variable frequency projection stripe measuring device. A multi-step variable frequency projection stripe measuring method is firstly used for roughly measuring an object to be measured so as to obtain a rough height range, and then the continuous variable angle digital holography interference measuring device or the variable wave length digital holography interference measuring device is used for precisely measuring the object to be measured so as to obtain the height information of all points of the object. According to the digital holography interference and frequency-changing projection stripe duplex measurement system and method, all the points of the object to be measured are measured independently in the measuring process, the phase unwrapping step is not needed, the surface type parameters of objects which are complex in shape and discontinuous can be measured, and compared with the unique multi-step variable frequency projection stripe measurement and the continuous variable angle digital holography interference or the variable wave length digital holography interference, the digital holography interference and frequency-changing projection stripe duplex measurement system and method have the advantage of being capable of meeting the requirement for high-precision measurement and the requirement for a large variation range of measuring heights at the same time.