This invention relates to the field of
electrical performance testing technology for insulating materials, and particularly to a device and method for testing the high-temperature
electrical performance of insulating materials. The device includes: a
rigid frame, a movable plate, a manual pressurization mechanism, an upper
electrode assembly, a lower
electrode assembly, an
electrical isolation structure, and a movable, split-type
heating system. The movable, split-type
heating system merges at the test position to form an annular heating cavity surrounding the insulating
material under test, and separates at non-test positions to
expose the insulating material. The method of this invention includes the following steps: a sample clamping step, a
thermal expansion compensation pressurization step, a dynamic thermal
cycling loading step, and a non-destructive withstand
voltage test step. The device and testing method of this invention can accurately reproduce the key service stress state of materials, and are as intuitive to operate, easy to maintain, and flexible to configure as general-purpose tools, thereby achieving a fundamental optimization between R&D depth, quality inspection efficiency, and overall cost.