The invention relates to the technical field of
test question difficulty prediction, and provides a circuit
test question difficulty assessment method and
system, and the method comprises the steps: obtaining a target parameter from a circuit
test question, and carrying out the extraction of knowledge points based on the target parameter; according to the extracted knowledge points, classifying the knowledge points according to six categories of memory, understanding, application, analysis, evaluation and creation of a Bloom cognitive
process dimension; determining the weight of each extracted knowledge point through an
analytic hierarchy process, and calculating the assignment value of each knowledge point; according to the assignment value of each knowledge point, the classified knowledge points and an
analytic hierarchy process, determining the weight of six categories of each knowledge point, and calculating the assignment value of each category of each knowledge point; and calculating a difficulty
score of the circuit test question based on the
score of each category of each knowledge point, and evaluating a difficulty coefficient of the circuit test question based on the difficulty
score of the circuit test question. The difficulty of the test question evaluation process can be effectively reduced, the accuracy of test question difficulty evaluation can be effectively improved, and the evaluation efficiency is effectively improved.