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A method for calibrating the rotation axis of a holographic interference four-axis measuring device

A technology of holographic interferometry and measurement equipment, which is applied in the field of calibration of the rotation axis of holographic interferometry four-axis measurement equipment, which can solve the problems of poor precision and achieve high precision and efficiency

Active Publication Date: 2019-10-18
HEILONGJIANG UNIVERSITY OF SCIENCE AND TECHNOLOGY
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Problems solved by technology

[0006] The invention aims to solve the problems of time-consuming calibration of the rotation axis and poor precision of the four-axis measurement equipment when measuring complex curved surface components, such as blades, by a system composed of a holographic interferometric ranging sensor and a four-axis measuring device. Calibration method for the rotating shaft of the shaft measuring equipment, based on the holographic interferometric ranging sensor to realize complex curved surface parts, such as blade 360

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[0022] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0023] auxiliary devices such as figure 1 As shown, it includes two CCD cameras 1-1 and cameras 1-2 and lenses, a tripod 3, a universal head 2, a plane target 4 and a base 5 for fixing and adjusting the angle of the plane target.

[0024] The relative positions of the camera 1-1 and the camera 1-2 are fixed, and the image of the planar target 4 is taken during the subsequent calibration process and sent to the computer.

[0025] The tripod 3 is used to support the phase 1-1, the camera 1-2, and adjust the positional relationship with the four-axis precision measuring equipment

[0026] The univer...

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Abstract

The invention relates to a calibration method for the rotation axis of a holographic interferometric four-axis measuring device. The error of fitting which is realized by means of the center of a standard ball is large, and as a result, the problem of inaccurate calibration of a rotation axis is brought about, while, with the measuring device of the invention adopted, the problem can be solved. The method is realized by means of a binocular stereoscopic image sensor and a planar target with a standard point. The method includes the following steps that: 1, the images of a planar target in a set of different positions are acquired; 2, a holographic interferometric sensor obtains the three-dimensional point cloud data of the planar target in the set of different positions; 3, the planar fitting of the planar target is carried out; 4, a set of vectors of a fitted plane and the rotation center of the fitted plane are obtained, the calibration value of the rotation axis is determined; 5, arotation matrix R and a translation vector T between two coordinate systems are solved; and 6, and the calibration of the rotation axis is completed in a unified manner in a coordinate system. The calibration method of the invention has high precision and high efficiency.

Description

technical field [0001] The invention belongs to the field of precision measurement, and in particular relates to a method for calibrating a rotation axis of a holographic interference four-axis measuring device. It can provide an efficient and precise calibration method for the precision measurement system composed of the holographic interference sensor and the four-axis measurement equipment. [0002] technical background [0003] Non-contact measurement is the best measurement method for complex parts. For example, the blade of an aero-engine is the core part that determines the energy conversion efficiency, operation safety and service life of an aero-engine. According to statistics, about 30% of the workload of an aero-engine comes from the blade. Because of its complex shape, thin and twisted surface, small front and rear edge radii (minimum diameter less than 0.1mm), high manufacturing and testing accuracy requirements, large feature sizes, and large quantities, etc. A...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01B11/00
Inventor 郭延艳何万涛孟祥林马鹤瑶边莉车向前
Owner HEILONGJIANG UNIVERSITY OF SCIENCE AND TECHNOLOGY
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