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Measurement method of material electric strain and its distribution based on digital holographic interferometry

A digital holography and electrostrain technology, applied in the direction of measuring devices, instruments, optical devices, etc., can solve the problems such as the influence of the test piece grid, and achieve the effects of high precision, convenient measurement, and strong practicability

Active Publication Date: 2020-01-03
TIANJIN UNIV
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

This method has the advantages of non-contact, full-field, real-time, and high resolution, but the quality of the specimen grid itself and the thickness of the adhesive layer will have a direct impact on the measurement results

Method used

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  • Measurement method of material electric strain and its distribution based on digital holographic interferometry
  • Measurement method of material electric strain and its distribution based on digital holographic interferometry
  • Measurement method of material electric strain and its distribution based on digital holographic interferometry

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Embodiment 1

[0021] Embodiment 1: as figure 2 The shown schematic diagram of the experimental light path is an example, and the specific measurement process of the measurement method of the present invention is set forth:

[0022] Step 1. Build figure 2 The reflective off-axis holographic optical system shown includes laser 1, beam expander collimation system 2, first and second beam splitters 3, 6, mirror 4, tested KNN material 5, CCD7, image acquisition card and computer 8. Voltage loading system 9; wherein: laser 1 is a helium-neon laser with a wavelength of λ=632.8nm, and the emitted laser beam forms a plane light wave after passing through a beam expanding collimation system, and is divided into two beams after passing through the first beam splitting prism 3, one The beam is reflected by the mirror 4 and the second dichroic prism 6, and reaches the CCD7 target surface as a reference light wave; one beam is irradiated on the surface of the KNN material 5 to be tested, and the refle...

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Abstract

The invention discloses a measuring method of material electrostrictive strain and distribution thereof based on digital holographic interferometry. The method comprises steps: applying an electric field on a tested material, recording digital holograms in different electric fields, performing numerical reconstruction, to obtain phase distribution; using a digital holographic interference technology, to obtain phase difference distribution under different states, through strain relations, calculating to obtain strain and distribution of materials; plotting points of corresponding strain values in different electric field to draw, to obtain an electrostrictive strain curve of the material, so as to obtain an inverse piezoelectric coefficient of the material. Compared with the prior art, a non-contact measuring method is used, and the method is characterized by simple principle, convenient measuring, low cost, high precision, and good practicality, and can dynamically measure strain distribution of a whole material surface in real time.

Description

technical field [0001] The invention belongs to the technical field of measuring piezoelectric properties of materials, and in particular relates to a method for measuring electric strain of materials and its distribution. Background technique [0002] Electrostrictive materials and piezoelectric materials are widely used in the field of sensors and micro-displacement drivers, and the measurement of micro-deformation is the basis for studying the strain characteristics of electrostrictive materials and piezoelectric materials. The deformation of such materials is very small, usually only a few tens of microns, or even smaller. Accurate measurement of the micro deformation is an important basis for studying the strain characteristics of materials. At present, the methods for measuring micro-deformation mainly include optical lever method, sensor method, laser interferometry, moiré interferometry, etc.: [0003] The optical lever method transmits the micro-displacement of the...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01B11/16
CPCG01B11/164
Inventor 吕且妮李弼华段少锋石佳
Owner TIANJIN UNIV
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