Test Method for Embedded Flash Memory

Abstract

The present invention discloses a testing method for an embedded flash memory. The testing method comprises the following steps: respectively presetting expected values of test items of a to-be-tested flash memory; simultaneously or respectively carrying out actual testing on the test items to obtain actually measured data values; storing the actually measured data values in an error trapping memory; carrying out parallel comparison on the actually measured data values and the preset expected values of all the test items in the flash memory one by one so as to determine whether each test item is qualified; when the actually measured data values of the test items are equal to the preset expected values of the preset test items, determining the test items are qualified, or otherwise, determining the test items are unqualified; and determining whether the flash memory is a qualified product, i.e. when all the test items are qualified, determining that the tested flash memory is a qualified product, or determining that the tested flash memory is an unqualified product. The testing method for the embedded flash memory, which is provided by the present invention, has the advantage of enabling the embedded flash memory to have a short test period, short consumed time, short testing time and the like.

Description

technical field [0001] The invention relates to the technical field of memory, in particular to a testing method of embedded flash memory. Background technique [0002] Embedded flash memory is used to store electronic data information. Since flash memory is a kind of non-volatile memory, data will not be lost even if the power is turned off. It has the advantages of repeated erasing, reading and writing, so it is widely used in mobile phones and digital cameras. , tablet computers and other electronic devices. However, before manufacturing the flash memory, it is necessary to test the electrical connection performance, power consumption, reading, writing, erasing, crosstalk and other parameters of the flash memory. In the testing method of the embedded flash memory in the prior art, when performing the parameter test of writing and reading, the expected values ​​of writing and reading of the flash memory chip need to be preset, and then the actual measured writing and read...

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Problems solved by technology

[0003] The disadvantage of the above test method is that when testing each parameter such as writing and reading, erasing and reading, crosstalk and reading, each actual measured data value needs to be compared with the preset parameter value Judging whether it is qualified or not, so that the overall parameter test time of embedded flash memory is longer, time-consuming, and test cycle is longer.

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