Automatic testing system of non-linear thermal parameter of high-power microwave device and testing method thereof

An automatic test system and high-power device technology, which is applied in the direction of instruments, measuring electronics, and measuring devices, can solve the problems of time-consuming, laborious, and inability to realize multi-parameter testing of a test system, etc.

Active Publication Date: 2016-04-20
UNIV OF ELECTRONICS SCI & TECH OF CHINA
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Problems solved by technology

The traditional manual test system is time-consuming and the measurement results are easily affected by the testers, so people began to study the automatic test system to obtain higher measurement accuracy
[0004] At present, people have partially realized the automatic measurement of nonlinear parameters of microwave high-power devices, but these methods all have some problems and defects. These test systems cannot realize the purpose of multi-parameter test for one connection. very strenuous

Method used

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  • Automatic testing system of non-linear thermal parameter of high-power microwave device and testing method thereof
  • Automatic testing system of non-linear thermal parameter of high-power microwave device and testing method thereof
  • Automatic testing system of non-linear thermal parameter of high-power microwave device and testing method thereof

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Embodiment Construction

[0041] Embodiments of the present invention are described below through specific examples, and those skilled in the art can easily understand other advantages and effects of the present invention from the content disclosed in this specification. The present invention can also be implemented or applied through other different specific implementation modes, and various modifications or changes can be made to the details in this specification based on different viewpoints and applications without departing from the spirit of the present invention.

[0042] This embodiment provides an automatic test system for nonlinear thermal parameters of microwave high-power devices, including: a control circuit module and a microwave circuit module;

[0043] Wherein the control circuit module comprises microwave switches 2, 4, 5, 7, 11, YTF adjustable filter 6, 13, data acquisition card 48; data acquisition card 48 communicates with microwave switches 2, 4, 5, 7, 11 through USB serial Connect...

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Abstract

The invention provides an automatic testing system of a non-linear thermal parameter of a high-power microwave device and a testing method thereof. The testing system comprises a control circuit module and a microwave circuit module. During a testing process, a vector network analyzer provides a signal source; connection with a correlated port of a microwave testing system is realized; and an MFC program is compiled by using a Microsoft Visual Studio 2012 to control a control circuit part of the system and obtain and display instrument testing data. With the Labview, adata collection program is complied for a six-port amplitude and phase testing module reserved in the system, thereby realizing automatic testing of a non-linear thermal parameter of a high-power microwave device. According to the invention, automatic switching of the testing circuit is realized; and in the testing system, the interface is reserved for the six-port amplitude and phase testing module, so that the cost of phase and amplitude testing of the high-power microwave device is reduced. An objective of automatic testing of a non-linear thermal parameter of a high-power microwave device within a broadband of 2G to 18G can be achieved. The system and method have characteristics of broadband, great convenience, rapidness, and high accuracy.

Description

technical field [0001] The invention belongs to the application field of microwave measurement, and in particular relates to an automatic test system and a test method for nonlinear thermal parameters of microwave high-power devices (high-power microwave devices). Background technique [0002] Microwave high-power devices are an extremely important class of electric vacuum electronic devices, which are widely used in satellite communications, radar and electronic countermeasures and play an important role. As a high-power device, its characteristics can be described by some technical parameters. To evaluate whether a microwave high-power device is qualified or whether it can meet its own application requirements, you can use its technical parameters as a reference. Microwave high-power devices are mainly aimed at amplifying high-frequency signals. The measurement of its technical parameters is designed to use a variety of microwave measurement techniques and high-end instru...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/00
CPCG01R31/00
Inventor 高勇李恩高冲刘天恒郑虎郭高凤张云鹏
Owner UNIV OF ELECTRONICS SCI & TECH OF CHINA
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