Automatic testing system of non-linear thermal parameter of high-power microwave device and testing method thereof
An automatic test system and high-power device technology, which is applied in the direction of instruments, measuring electronics, and measuring devices, can solve the problems of time-consuming, laborious, and inability to realize multi-parameter testing of a test system, etc.
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[0041] Embodiments of the present invention are described below through specific examples, and those skilled in the art can easily understand other advantages and effects of the present invention from the content disclosed in this specification. The present invention can also be implemented or applied through other different specific implementation modes, and various modifications or changes can be made to the details in this specification based on different viewpoints and applications without departing from the spirit of the present invention.
[0042] This embodiment provides an automatic test system for nonlinear thermal parameters of microwave high-power devices, including: a control circuit module and a microwave circuit module;
[0043] Wherein the control circuit module comprises microwave switches 2, 4, 5, 7, 11, YTF adjustable filter 6, 13, data acquisition card 48; data acquisition card 48 communicates with microwave switches 2, 4, 5, 7, 11 through USB serial Connect...
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