A non-vacuum thermoelectric refrigeration device for area array ccd

Abstract

The invention discloses a non-vacuum thermoelectric refrigeration device used for an area array CCD. The non-vacuum thermoelectric refrigeration device comprises a sealing cavity sealed by an upper cover, the periphery of the cavity and a radiating base, wherein a glass sealing window is formed in the upper cover; a charging port is formed in one side wall of the periphery of the cavity, and an electrical interface is formed in the other side of the periphery of the cavity; a TEC refrigeration sheet, a cold finger, a CCD chip and a temperature sensor are arranged inside the cavity; and the cavity is filled with inert gas nitrogen. The TEC refrigeration sheet is fixed on the radiating base through TEC fixed nuts, the cold finger is fixed at the cold end of the TEC refrigeration sheet, the CCD chip is fixed on the cold finger, the light-sensitive surface of the CCD chip directly faces the glass sealing window, the area of the glass sealing window is greater than the imaging area of the CCD chip, and the temperature sensor is fixed on the side, close to the CCD chip, of the cold finger. The non-vacuum thermoelectric refrigeration device is simple in design structure and good in refrigeration effect, and is suitable for occasions with the refrigeration temperature of more than -30 DEG C, so that the influence of thermal noise for signals and the influence of water vapor for light paths are reduced.

Description

technical field [0001] The invention relates to a photoelectric detector refrigeration technology, in particular to a non-vacuum thermoelectric refrigeration device for an area array CCD, which can satisfy the packaging of an area array CCD detector with low cooling requirements. Background technique [0002] In the field of photodetectors, many detectors are semiconductor detectors. Semiconductor detectors are particularly sensitive to temperature. Especially when detecting weak signals, it is necessary to remove the influence of temperature. For example, for scientific grade CCDs, at room temperature , the dark current will have a very large impact, and for weak signal input, the image quality will be very poor. Dark current refers to the thermal current generated when semiconductor photoelectric imaging devices work without light. Its existence will have a certain impact on the imaging quality of photoelectric devices. The size of the dark current is related to the temp...

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Problems solved by technology

[0002] In the field of photodetectors, many detectors are semiconductor detectors. Semiconductor detectors are particularly sensitive to temperature. Especially when detecting weak signals, it is necessary to remove the influence of temperature. For example, for scientific grade CCDs, at room temperature , dark current will have a very large impact, and for weak signal input, the image quality will be very poor

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