An image-based method for measuring plant leaf area
A measurement method and leaf technology are applied in the field of plant leaf area measurement, which can solve the problems of poor image quality and low measurement accuracy, and achieve the effects of improving accuracy, eliminating influence, and promoting application value.
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0020] In order to make the objects and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the examples. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.
[0021] The blade backlight shooting and image-assisted affine correction device used in the embodiment of the present invention is as follows: Figure 1-2 As shown, the upper surface of the blade backlight shooting and image-assisted affine correction device is provided with a perspective correction frame 1 and eight red rectangles a, b, c, d, e, f, g, and h, and the area of each red rectangle has been known, denoted as S a , S b , S c , S d , S e , S f , S g , S h , the four vertices of the perspective correction frame are A, B, C, and D respectively. A surface light source is installed at the bottom of the device. The surface light s...
PUM

Abstract
Description
Claims
Application Information

- R&D
- Intellectual Property
- Life Sciences
- Materials
- Tech Scout
- Unparalleled Data Quality
- Higher Quality Content
- 60% Fewer Hallucinations
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2025 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com