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Method for quantitatively selecting test point in design-for-test

A test point and testing technology, applied in the test field, can solve problems such as insufficient diagnostic ability and waste of test resources

Inactive Publication Date: 2016-08-03
BEIHANG UNIV
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Problems solved by technology

However, due to its subjectivity and experience, the conventional test point selection method leads to insufficient diagnostic ability and a large waste of test resources. Therefore, it is necessary to design an intelligent test set optimization algorithm for quantitative selection.

Method used

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  • Method for quantitatively selecting test point in design-for-test
  • Method for quantitatively selecting test point in design-for-test
  • Method for quantitatively selecting test point in design-for-test

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Embodiment Construction

[0051] The present invention will be further described in detail with reference to the accompanying drawings and embodiments.

[0052] The present invention is a method for quantitatively selecting test points in a testable design, the process of which is as follows: figure 1 shown, including the following steps:

[0053] Step 1, obtain system initialization parameters, including: population size, population initial position, speed, acceleration factor, maximum speed, maximum number of iterations;

[0054] Step 2, calculate the fitness of each particle in the system, and establish an adaptive function, according to the formula:

[0055] f i t n e s s = w 1 ′ · 1 m i n ( c ( T ...

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Abstract

The invention discloses a method for quantitatively selecting a test point in design-for-test. The method comprises the following steps: I, acquiring a system initializing parameter; II, calculating population fitness, and building an adaptive function; III, updating a global optimal value of particle individuals and a population; IV, judging whether an algorithm enters a convergence state or not, and determining an inertia weight; V, judging whether a maximum number of iterations is reached or not, and giving an optimal test point if the maximum number of iterations is reached. Compared with the prior art, the method has the advantages that an optimal result of test point quantitative selection in the design-for-test can be enhanced effectively, the design-for-test index detection rate and isolation rate are increased, and the design-for-test cost is reduced.

Description

technical field [0001] The invention belongs to the technical field of testing, in particular to a method for quantitatively selecting test points in testing design. Background technique [0002] Due to the wide application of computer technology, microelectronics technology and embedded technology, the technical level of avionics product manufacturing design has been developed rapidly. At present, avionics systems are further developing towards complexity and scale. The important design feature of isolation must be paid attention to from the design stage, and how to select the test point directly affects the level of diagnostic performance. However, due to its subjectivity and experience, conventional test point selection methods lead to insufficient diagnostic capabilities and a large waste of test resources. Therefore, it is necessary to design an intelligent test set optimization algorithm for quantitative selection. In order to improve the test and diagnosis capabiliti...

Claims

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Application Information

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IPC IPC(8): G06F19/00G06N3/00
CPCG06N3/006G16Z99/00
Inventor 侯文魁张秩铭闫俊锋姚国平
Owner BEIHANG UNIV
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