Test point quantitative selection method and device in testing design

Abstract

The invention discloses a method and device for quantitatively selecting test points in test design, belonging to the field of test optimization design, including step 1: establishing a correlation matrix between failure modes and test points; step 2: according to the correlation matrix, Define testable parameters detection rate (FDR) and isolation rate (FIR) respectively; Step 3: Establish constraints: FIR>β; optimize the objective function: Step 4: Use traversal search or intelligent search algorithm to obtain the test point set that makes the objective function value Fx the smallest, and this test point set is the optimal test point set; compared with the prior art, the present invention can effectively improve large-scale and complex The design-for-test effect of the avionics system improves the detection rate and isolation rate of design-for-test indicators, and reduces the design-for-test cost.

Description

technical field [0001] The present invention relates to the field of testability optimization design, in particular to a method and device for quantitatively selecting test points in testability design. Background technique [0002] Testability is a design characteristic of equipment that can promptly and accurately determine its status (workable, non-workable, or degraded) and isolate its internal faults. The level of testable design can improve the combat readiness, mission reliability and safety of equipment, reduce maintenance manpower and other test resources, and reduce life cycle costs. With the wide application of testability technology in various fields of the defense industry, units at all levels have also raised the importance of testability to a certain height. Testability verification and modeling work are applied in each model. However, reflected in product design, the testing design work in the research and development stage is in an awkward position. The te...

AI Technical Summary

Problems solved by technology

However, this approach is very subjective, and it is impossible to associate modules (functions), faults, and information flow. It is prone to problems such as low coverage of fault modes or repeated tests, and it is difficult to be objective and effective. and cause a lot of waste

At the same time, due to the lack of effective means of selecting test points, the selection of test points based on subjective experience often cannot take into account testability indicators and costs well.

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