A AFDD Test System Based on Parallel Metallic Contact Arc Fault
A contact arc and testing system technology, applied in the direction of measuring devices, measuring electrical variables, instruments, etc., can solve the problems of inability to cut live wires, difficult automatic control, and various types of test cable sizes and specifications.
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[0027] The present invention will be further described below in conjunction with the accompanying drawings and specific embodiments.
[0028] Such as Figure 1~4 As shown, the present invention provides a kind of AFDD test system based on parallel metal contact arc fault, including cutting cable test device, AFDD test device electrically connected with the cut cable test device and carrying out data communication with the AFDD test device The upper computer measurement and control analysis platform; the AFDD test system includes an MCU control unit, a first isolation control module, a second isolation control module, an AFDD test module and a tripping detection module, and the MCU control unit passes through the first isolation control module The AFDD test module is electrically connected to the AFDD test module, and the AFDD test module is electrically connected to the first isolation module through the tripping detection module; the MCU control unit is electrically connected...
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