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Test device and method for acquiring impact crater samples different in size and distribution at time

A test device, a one-time technology, applied in the direction of using a single impact force to test the strength of materials, measuring devices, sampling, etc., can solve the problems of high test cost and long cycle, achieve short test time, shorten test cycle, and reduce energy consumption and the effect of trial costs

Inactive Publication Date: 2016-08-24
HARBIN INST OF TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] The present invention aims to solve the problems of high test cost and long period in the existing high-speed impact test for obtaining impact crater samples, and proposes a test device and method for obtaining impact crater samples of different sizes and different distributions at one time

Method used

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  • Test device and method for acquiring impact crater samples different in size and distribution at time
  • Test device and method for acquiring impact crater samples different in size and distribution at time
  • Test device and method for acquiring impact crater samples different in size and distribution at time

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specific Embodiment approach 1

[0023] Embodiment 1: A test device for obtaining impact crater samples of different sizes and different distributions at one time, the device includes a vertical plate 1, a sample 2 and a vertical plate 2 3;

[0024] One side of the vertical plate 1 is facing the incident projectile, the other side is provided with the vertical plate 2 3, and the sample 2 is installed on the side of the vertical plate 2 3 facing the vertical plate 1, and the vertical plate 1 is relatively parallel to the vertical plate 2 3.

specific Embodiment approach 2

[0025] Embodiment 2: This embodiment differs from Embodiment 1 in that: the vertical plate 1 (priority) adopts an alloy plate, and the vertical plate 2 3 has the same order of magnitude of dynamic stiffness as the sample 2.

[0026] The vertical plate 23 plays the role of fixing the sample, and at the same time ensures that the pit forming process of the sample 2 is complete, and its dynamic stiffness should be close to that of the sample 2.

specific Embodiment approach 3

[0027] Embodiment 3: This embodiment is different from Embodiment 1 or Embodiment 2 in that: the number of samples 2 is 1-50.

[0028] The sample 2 can be single or multiple, and the shape and size of multiple samples 2 can be the same or different, and the shape of the sample 2 can be plate-shaped or other shapes.

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Abstract

The invention relates to a device and method for acquiring impact crater samples, in particular to a test device and method for acquiring impact crater samples different in size and distribution at a time. The test device and method aim at solving the problems that an existing high-speed impact test for acquiring impact craters is high in test cost and long in period. The device comprises a first vertical plate (1), a sample (2) and a second vertical plate (3). The method comprises the steps that 1, the device is designed, and the incident pill impacting speed is set; 2, high-speed impacting process simulation is carried out according to the device and the incident pill impacting speed, and test parameters are determined; 3, after the size and distribution of the sample (2) are designed according to the determined test parameters, the first vertical plate (1), the second vertical plate (3) and the sample (2) are fixed, a high-speed impacting test is carried out, and impact craters different in size and distribution are obtained on the surface of the sample (2). The device and method are applied to the field of impact crater acquiring tests.

Description

technical field [0001] The invention relates to a test device and method for obtaining impact crater samples. Background technique [0002] Space debris refers to all man-made objects in space except spacecraft that are working normally, including waste abandoned in space during normal work, fragments of accidental disintegration, peeling paint flakes on the surface of spacecraft, solid rocket jets, etc. These debris are related to spaceflight The average relative impact velocity of spacecraft is 10km / s, and they are mainly distributed in the low-earth orbit area below 2000km, which seriously threatens the safe operation of near-Earth space spacecraft in orbit. Therefore, it is of great significance to use high-speed launch equipment to simulate the impact process of space debris on the ground, and to study the impact of space debris on spacecraft materials, components, components, protective materials and structures. [0003] A large number of battlefield statistics in mod...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N1/28G01N3/30
CPCG01N1/286G01N3/30
Inventor 覃耀春何世禹常云琪
Owner HARBIN INST OF TECH
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