Closed coaxial transmission line test system and method for representing dielectric property of sample to be tested

A technology for testing systems and dielectric properties, which is applied in measuring electrical variables, measuring resistance/reactance/impedance, measuring devices, etc. It can solve the difficulty of expanding the test frequency range, the limited working range of coaxial transmission line fixtures, and the difficulty of removing parasitic effects, etc. problems, to achieve the effect of good test repeatability, accurate and reliable removal results, and a wide range of applications

Active Publication Date: 2016-09-07
DALIAN UNIV OF TECH
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Problems solved by technology

[0005] For the coaxial transmission line test method in the prior art, it is difficult to remove the parasitic effect generated by the connector in the test fixture during the test process. Specific test m

Method used

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  • Closed coaxial transmission line test system and method for representing dielectric property of sample to be tested
  • Closed coaxial transmission line test system and method for representing dielectric property of sample to be tested
  • Closed coaxial transmission line test system and method for representing dielectric property of sample to be tested

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Embodiment Construction

[0041] In order to achieve the above effects, the invention will be further described below in conjunction with the accompanying drawings and embodiments:

[0042] A closed coaxial transmission line test system for characterizing the dielectric properties of liquid and solid materials, such as figure 2 As shown, it includes a test fixture, a vector network analyzer 9, a computer 10 and a test connection line 11; the schematic diagram of the cross-sectional structure of the test fixture is as follows figure 1 shown, the test fixture includes bidirectional SMA connectors ( image 3 , 4), screws 4, waterproof rubber washers 5, adapters 6 with open connection structure at both ends (such as Figure 5 , 6, 7), the sample chamber 7 with electromagnetic shielding effect (such as Figure 9 ), the sample chamber conductor 8 (such as Figure 8 ) and the sample to be tested.

[0043] The two-way SMA joint is composed of a four-hole flange 1, a cylindrical cylindrical polytetrafluoro...

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Abstract

The invention discloses a closed coaxial transmission line test system for testing dielectric property of liquid and solid materials. The closed coaxial transmission line test system comprises a test fixture, a vector network analyzer, a computer and a test connection line. The test fixture comprises a both-way SMA connector, screws, waterproof rubber washers, adapters, the two ends of each of which are opened and which are in a communication structure, a sample room having an electromagnetic shielding effect, a sample indoor conductor and a sample to be tested. The both-way SMA connector is formed by four-hole flanges, columnar cylindrical polytetrafluoroethylene and both-way SMA connector dual-female-connector coaxial inner conductors. Based on the organic combination of a transmission reflection method and de-embedding technology, test parasitic effect of a fixture interface is eliminated under the condition of not depending on a special customized calibration device or not carrying out complex mathematical modeling, thereby realizing accurate measurement of the dielectric property of the liquid and solid materials; processing requirement for the test sample is low; the fixture installation is simple; test work frequency range is flexible to expend; and application range is wide.

Description

technical field [0001] The invention belongs to the field of microwave testing, relates to the characterization of the dielectric properties of liquid materials, solid or solid powder materials, and particularly relates to a closed coaxial transmission line testing system for characterizing the dielectric properties of liquid and solid materials. Background technique [0002] The dielectric properties of a material are electrical characteristics unique to each material, and accurate measurement and characterization of the dielectric properties of a material is critical to its proper use. By mastering the dielectric properties of materials, key design parameter information can be provided for many electronic applications. To help, quickly and accurately grasp the dielectric properties of materials to improve the efficiency of product design and process quality inspection in the industry. [0003] For the measurement of dielectric properties of materials, there are mainly coa...

Claims

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Application Information

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IPC IPC(8): G01R27/26
CPCG01R27/2623
Inventor 拉塞尔孙振翔刘长睿柳丽芬孙守林
Owner DALIAN UNIV OF TECH
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