Device and method for measuring voltage drop of chip

A measurement device and measurement method technology, applied in the field of measurement, can solve the problems of uncertain time window, inaccurate chip measurement results, etc.

Active Publication Date: 2016-10-05
LOONGSON TECH CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0005] The present invention provides a device and method for measuring chip voltage drop to solve the problem that the actual input clock signal is not an ideal standard clock signal and the time window is uncertain when measuring the chip voltage drop in the prior art. A problem that caused inaccurate measurement results of chip voltage drop

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  • Device and method for measuring voltage drop of chip
  • Device and method for measuring voltage drop of chip
  • Device and method for measuring voltage drop of chip

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Embodiment 1

[0047] figure 1 It is a schematic structural diagram of a chip voltage drop measurement device provided by Embodiment 1 of the present invention. The measurement device provided in this embodiment is suitable for measuring the internal pressure drop of the chip. The measurement device is usually implemented by hardware and software methods, and can be integrated in the processor of the terminal device, for example, set in the processor chip, the measurement processor The internal voltage drop of the chip. Such as figure 1 As shown, the measurement device of this embodiment may include: a voltage controlled oscillator 11, an inverter delay chain 12 and a data processing module 13 provided in the chip.

[0048] The voltage controlled oscillator 11 is used to generate a clock signal, wherein when the voltage drop of the chip changes, the frequency of the clock signal generated by the voltage controlled oscillator 11 changes with the change of the voltage drop of the chip.

[0049] Th...

Embodiment 2

[0068] figure 2 It is a schematic structural diagram of a device for measuring the voltage drop of a chip provided in the second embodiment of the present invention. In the above figure 1 On the basis of the device shown, in the measuring device provided in this embodiment, the inverter delay chain 12 is also used to measure the voltage-controlled oscillator 11 generated by the chip at different operating voltages when the chip is not in operation. The frequency of the clock signal to obtain the curve model of the frequency of the clock signal and the operating voltage; correspondingly, the data processing module 13 is also used to obtain the frequency of the clock signal and the curve according to the current measurement of the inverter delay chain 12 Model to obtain the chip voltage drop at the current frequency.

[0069] In this embodiment, the reference value of the chip voltage drop can be measured in advance to obtain the true value of the chip voltage drop when measuring ...

Embodiment 3

[0094] Figure 4 This is a flowchart of a method for measuring the voltage drop of a chip provided in the third embodiment of the present invention. The measurement method provided in this embodiment is suitable for measuring the internal voltage drop of a chip. The method can be performed by a device for measuring the voltage drop of a chip provided in the chip. The device is usually implemented by hardware and software methods, including interconnected The voltage controlled oscillator and inverter delay chain can be integrated in the processor of the terminal device, for example, set in the processor chip to measure the internal voltage drop of the processor chip. Such as Figure 4 As shown, the measurement method of this embodiment may include:

[0095] S110: The voltage controlled oscillator generates a clock signal whose frequency changes with the voltage drop of the chip according to the change of the voltage drop of the chip.

[0096] The voltage-controlled oscillator that...

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Abstract

The invention provides a chip voltage drop measuring device and method. The device for measuring the chip voltage drop provided by the present invention includes: a voltage-controlled oscillator, an inverter delay chain, and a data processing module arranged in the chip; the voltage-controlled oscillator is used to generate a clock signal, and when the chip voltage drop changes, The frequency of the clock signal generated by the voltage-controlled oscillator changes with the voltage drop of the chip; the inverter delay chain is connected with the voltage-controlled oscillator to measure the clock signal generated by the voltage-controlled oscillator when the chip is in different working states The frequency; the data processing module is connected with the inverter delay chain, and is used to obtain the frequency of the clock signal generated by the voltage-controlled oscillator when the chip is in different working states according to the measurement of the inverter delay chain, and obtain the voltage drop of the chip amount of change. The invention solves the problem of inaccurate measurement results of the chip voltage drop due to the uncertain time window of the input clock signal when measuring the chip voltage drop in the prior art.

Description

Technical field [0001] The invention relates to measurement technology, in particular to a device and method for measuring the pressure drop of a chip. Background technique [0002] As the chip manufacturing process enters the deep sub-micron era, its development direction usually includes increasing the frequency of the chip and reducing the operating voltage of the chip. However, the chip voltage drop directly affects the increase of the chip frequency. [0003] At present, by calculating the impact of the chip voltage drop on the frequency, a margin is added in the chip design process to compensate for the adverse effects caused by the chip voltage drop; the usual measurement circuit mainly includes an inverter delay chain, which uses the inverter to delay The chain directly measures the period, frequency and clock jitter of the clock signal, and calculates the chip voltage drop based on the measured information of the clock signal. Specifically, the measurement circuit can be ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R19/10
Inventor 张译夫杨梁
Owner LOONGSON TECH CORP
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