Laser life test fixing clamp

Abstract

The invention relates to a laser life test fixing clamp. At least two lasers are tested simultaneously in a laser life test. The laser life test fixing clamp comprises a conductive pipe, and positive electrode pedestals, negative electrode pedestals, laser positive electrode sheets, laser negative electrode sheets and conductive sleeves corresponding to lasers one by one, wherein each conductive sleeve sleeves the conductive pipe, insulation sleeves are arranged between adjacent two conductive sleeves, one end of each laser positive electrode sheet is connected with the corresponding positive electrode pedestal, the other end of each laser positive electrode sheet is provided with a first bayonet matching with the peripheral shape of the conductive sleeves, one end of each laser negative electrode sheet is connected with the corresponding negative electrode pedestal, and the other end of each laser negative electrode sheet is provided with a second bayonet matching with the peripheral shape of the conductive pipe. Serial electrical connection of devices is realized, and electric signal distortion problem caused by electromagnetic induction between leads during a conventional lead input process is effectively solved. Stability of input conditions of a tested device is ensured, damage due to distortion signals can be prevented, and test accuracy is improved.

Description

technical field [0001] The invention relates to the technical field of laser life test, in particular to a fixing fixture for laser life test. Background technique [0002] A single bar laser refers to a semiconductor laser device obtained by horizontally integrating multiple semiconductor laser unit devices in parallel on a chip substrate of 1 cm in order to obtain high power output. The assessment of the lifetime of single-bar lasers has always been one of the key tasks of high-power semiconductor laser development and application units, especially for high-power quasi-continuous microchannel water-cooled single-bar devices. At present, in the process of testing high-power quasi-continuous microchannel water-cooled single-bar devices, the problem of distortion of electrical input signals often occurs during the connection process of multi-position devices due to electromagnetic induction between leads, which affects the accuracy of the test. Contents of the invention ...

AI Technical Summary

Problems solved by technology

At present, during the testing process of high-power quasi-continuous microchannel water-cooled single-bar devices, the problem of distortion of electrical input signals often occurs during the connection process of multi-position devices due to electromagnetic induction between leads, which affects the accuracy of the test.

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