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High-compatibility quick-charging product aging testing system

An aging test and compatibility technology, applied in power supply testing and other directions, can solve the problems of low compatibility, low intelligence and low efficiency of test instruments and methods, and achieve improved efficiency and convenience, high intelligence, and improved The effect of production efficiency

Active Publication Date: 2016-11-16
东莞市旺达富自动化设备有限公司
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Problems solved by technology

[0009] In view of the existing technology, the aging test method of fast charging charger, mobile power supply and fast charging mobile power supply in the production process is extremely low in intelligence, high in cost and low in efficiency, and the compatibility of test instruments and methods is extremely low. Different products require Different test instruments and methods are used to carry out aging tests and other defects. The present invention provides a highly compatible fast-charging product aging test system, which has the advantages of high intelligence, high compatibility, low cost, and high efficiency.

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Embodiment Construction

[0039] The structure and working mode of the device in specific embodiments will be described below with reference to the accompanying drawings, and the working principle of the device will be introduced in detail. It should be noted that the embodiment described below is only a typical embodiment of the device in actual use. Workers can completely realize numerous other embodiments based on the principle of the device.

[0040] according to figure 1 As shown, a high-compatibility fast charging product aging test system of the present invention includes: grid power supply module, host computer monitoring system, main control unit MCU module, charging control module, charging voltage and current acquisition module, fast charging control module, Sub-control unit MCU module, discharge control module, discharge voltage and current acquisition module, RS232 to RS485 communication module, address dial switch, cooling system.

[0041] The MCU module of the main control unit is elec...

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Abstract

The invention relates to the technical field of the power performance testing, particularly to an integrated aging testing system being compatible with a quick-charging charger, a quick-charging mobile power supply, and a universal mobile power supply. The testing system comprises a grid power supply module, an upper computer monitoring system, a main micro controller unit (MCU) module, a charging control module, a charging voltage and current acquisition module, a quick charging control module, a sub control unit MCU module, a discharging control module, and a discharging voltage and current acquisition module. According to the invention, the provided high-compatibility quick-charging product aging testing system has advantages of high intelligent degree, high compatibility, low cost, and high efficiency.

Description

technical field [0001] The invention relates to the technical field of power supply performance testing, in particular to a comprehensive aging test system for a compatible fast-charging charger, a fast-charging mobile power supply and a universal mobile power supply. Background technique [0002] With the popularity of handheld digital products such as smartphones, tablet computers, and digital cameras, these power-hungry smart devices have spawned products such as fast-charge chargers, mobile power banks (ie power banks), and fast-charge mobile power supplies. enter the market. Fast charging technology and mobile power provide a better solution to the shortcomings of high power consumption and low battery life of smart devices. It can quickly charge mobile phones, tablet computers, digital camera batteries, etc., and is easy to carry and charge on the go. , is expected to capture most of the market in the short term. Along with the application of these fast-charging prod...

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Application Information

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IPC IPC(8): G01R31/40
CPCG01R31/40
Inventor 邱水良冉建强赵朝映
Owner 东莞市旺达富自动化设备有限公司
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