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Load plate for batch testing of photoelectric detectors and load plate system

A photodetector, batch testing technology, applied in the direction of instruments, etc., can solve the problems of low measurement efficiency, unfavorable for statistical analysis of photodetectors, scattered test results, etc., and achieve the effect of rapid statistical analysis

Active Publication Date: 2016-11-23
WUHAN JOINBON TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The measurement efficiency of a single test carrier is low, time-consuming and laborious, and because the detectors to be tested need to be replaced continuously, it is impossible to realize the simultaneous measurement of multiple detectors, which is not conducive to large-scale testing
In addition, due to the use of a single test carrier, the test results are relatively scattered, which is not conducive to systematic statistical analysis of photodetectors manufactured in the same batch

Method used

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  • Load plate for batch testing of photoelectric detectors and load plate system
  • Load plate for batch testing of photoelectric detectors and load plate system
  • Load plate for batch testing of photoelectric detectors and load plate system

Examples

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Embodiment Construction

[0020] Please see attached figure 1 to the attached Image 6 . A carrier plate for batch testing of photodetectors, wherein an air circuit layer (100) and a chip fixing layer (200) are arranged in sequence from bottom to top, and the air circuit layer (100) and the chip fixing layer (200) are hermetically connected ; the air path layer (100) includes an air cavity (103) and an air suction hole (102), and the air cavity (103) is connected to the outside through the air suction hole (102); the chip fixing layer (200) includes M rows and N columns (the values ​​of M and N are both greater than or equal to 1, in this embodiment, M and N are both equal to 3) regularly arranged chip slots (201), as well as signal terminal metal posts (205), power terminal metal A pile (206), an air hole (204), a signal terminal metal lead (207), a power terminal metal lead (208), a signal output contact slot (202) and a power input contact slot (203); the surface of the chip slot (201) The width ...

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PUM

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Abstract

The invention discloses a load plate for batch testing of photoelectric detectors and a load plate system. The load plate for batch testing comprises multiple chip slots distributed in an array mode, air holes, an air suction hole, signal-end metal piles, signal-end metal leads, signal output contact slots, power-end metal piles, power-end metal leads and power input contact slots. The chip slots, the air holes and the air suction hole are used for fixing the photoelectric detectors to be tested; the signal-end metal piles, the signal-end metal leads and the signal output contact slots are used for reading measurement signals of the photoelectric detectors to be tested; the power-end metal piles, the power-end metal leads and the power input contact slots are used for supplying power to the photoelectric detectors to be tested. The load plate can quickly and efficiently test hundreds of the photoelectric detectors simultaneously and can quickly read multiple testing quantities conveniently to quickly count and analyze the testing quantities conveniently.

Description

technical field [0001] The invention relates to the field of microelectronics and optoelectronic testing, in particular to a batch testing tray and tray-loading system which can be used to detect or test multiple photodetectors at the same time. Background technique [0002] The detection or testing of photodetectors involves the measurement of electrical and optical quantities. At present, the measurement method of photoelectric detectors generally adopts a single product test carrier. The tester places a single detector to be tested on a single product test carrier to fix it, and then assembles it into the test system. Measurement of optical quantities such as measurement and spectral response. Using a single test carrier plate to measure is inefficient, time-consuming and labor-intensive, and since the detectors to be tested need to be constantly replaced, simultaneous measurement of multiple detectors cannot be achieved, which is not conducive to large-scale testing. I...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01D18/00
CPCG01D18/00
Inventor 李开富徐青王麟杨健
Owner WUHAN JOINBON TECH CO LTD