A Method of Studying Micro-disturbance of Electromagnetic Field Probe by Changing the Position of Electromagnetic Field Probe

Abstract

The invention relates to a method for studying probe micro-disturbance by changing positions of an electromagnetic field probe. The method comprises the following steps of 1, obtaining a matrix Fi of intensity of a testing electromagnetic field of the electromagnetic field probe under the condition of different probe positions; 2, utilizing simulation software to simulate the distribution of electromagnetic fields produced by a radiation source on different observation planes Pindex under the probe condition, and obtaining a matrix Fieh1 of the intensity of the simulated electromagnetic field under the probe condition; 3, comparing the matrix Fi and the matrix Fieh1, and determining a simulation module; 4, utilizing the simulation software to simulate the distribution of electromagnetic fields produced by the radiation source on different observation planes Pindex under the non-probe condition, and obtaining a matrix Fieh0 of the intensity of the simulated electromagnetic field under the non-probe condition; 5, comparing the matrix Fieh1 and the matrix Fieh0. The method has the advantages that the testing data of the electromagnetic field probe in engineering can be corrected according to the obtained data, the confidentiality of the testing results of the electromagnetic field probe is obviously improved, the accuracy of modeling in the simulation process is guaranteed, and the result data is only related with the relative position of the electronic field probe and a radiation source plane.

Description

【Technical field】 [0001] The invention relates to a method for studying the micro-disturbance of an electromagnetic field probe, in particular to a method for studying the micro-disturbance of the electromagnetic field probe by changing the position of the electromagnetic field probe, specifically to study the electromagnetic field probe due to the difference between the probe and the radiation source during the application process. Different relative positions produce different micro-perturbations. 【Background technique】 [0002] With the rapid development of science and technology, the wide application of large-scale integrated circuits and the increasing operating frequency of circuits, every module and even every section of wiring in electrical equipment may be a source of electromagnetic interference. Electromagnetic interference not only affects the normal operation of the system, but also may cause serious accidents in severe cases. During the system-level electromag...

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Problems solved by technology

[0003] Traditionally, the disturbance of the electromagnetic field distribution radiated by the device under test due to the metal structure of the probe is often ignored. The field distribution measured by the probe is not the actual field distribution value, which is an important factor affecting the use effect of the probe.

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