A Method for Characterizing Grain Strain Combining with In Situ Electron Backscattered Diffraction Technique
A technique of electron backscattering, grain, applied in the direction of testing material strength, instruments, measuring devices, etc. by applying stable tension/pressure
Active Publication Date: 2019-05-17
INST OF GEOLOGY & GEOPHYSICS CHINESE ACAD OF SCI
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[0006] In view of this, the technical problem to be solved in the present invention is how to accurately characterize the microscopic unit grain strain of the material in the process of plastic deformation
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[0039]In material mechanics, the deformation of a material can be described by Poisson's ratio, that is, the transverse deformation coefficient of the material. Poisson's ratio ν specifically refers to the ratio of the transverse (radial) normal strain caused by uniformly distributed longitudinal stress (such as axial tension / compression of the specimen) to the corresponding longitudinal (axial ) ratio of the absolute value of positive strain, that is
[0040] ν=-ε x / ε y
[0041] In the above formula, ε x Indicates the transverse strain of the specimen, ε y is the longitudinal strain of the specimen.
[0042] The above-mentioned Poisson’s ratio theory is applicable to both elastic deformation and plastic deformation of materials. For traditional materials (such as metals), in the range of elastic deformation, ν is generally a constant, but in the plastic deformation stage beyond the elastic range, Poisson's ratio ν increases with increasing stress until ν = 0.5. Howeve...
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Abstract
The invention relates to a method for representing strain of crystal grains by the aid of in-situ electron back scattering diffraction technologies. The method includes carrying out in-situ tensile tests on test specimens in scanning electron microscopes, carrying out in-situ electron back scattering diffraction crystal oriented scanning on the test specimens in each macroscopic strain phase when the test specimens are stretched and are in set different macroscopic strain phases and acquiring in-situ crystal orientation information and crystal grain dimensional parameter information of the test specimens in the macroscopic strain phases; qualitatively representing the strain of the crystal grains in plastic deformation procedures of the test specimens on the basis of the crystal orientation information by the aid of strain analysis processes of the electron back scattering diffraction technologies; acquiring target parameters on the basis of the crystal grain dimensional parameter information in set modes and quantitatively representing the strain of the crystal grains in the plastic deformation procedures of the test specimens by the aid of change of the target parameters. The strain of the crystal grains can be reflected by the target parameters. The method has the advantage that the strain of the crystal grains can be qualitatively and quantitatively represented by the aid of the method in plastic deformation procedures of materials.
Description
technical field [0001] The invention relates to the field of microscopic grain strain of materials, in particular to a method for characterizing grain strain combined with an in-situ electron backscattering diffraction technique. Background technique [0002] The mechanical properties of materials (such as strength, hardness, plasticity and toughness, etc.) are related to the strain state of the material. When the material is loaded, a certain degree of macroscopic strain will occur, which can directly reflect the elastic-plastic deformation behavior of the material. However, the macroscopic strain of the material is only the result of the comprehensive performance of the strain of countless grains in the material. The continuous deformation of the material at the macroscopic level does not represent the continuity of its microscopic deformation. Usually, the degree of deformation at each point in the material does not vary. The same and even obvious differences. The strain...
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IPC IPC(8): G01N3/08G01N3/06
CPCG01N3/066G01N3/08
Inventor 唐旭毛圣成谷立新杨赛红臧科涛潘永信
Owner INST OF GEOLOGY & GEOPHYSICS CHINESE ACAD OF SCI