Satellite element service life evaluation method based on aging test data before assembly

A technology of test data and evaluation method, applied in the field of life evaluation of satellite components, can solve the problems of unpredictable on-site reliability, expensive implementation, and inaccurate reliability prediction results.

Inactive Publication Date: 2016-12-07
BEIHANG UNIV
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Problems solved by technology

With the development of science and technology, especially the development process of Moore's law of electronic devices, the update of the traditional reliability prediction model is seriously behind, and its reliability prediction results are no longer accurate
The life evaluation method based on the failure physical model cannot predict the on-site reliability of the installed components; at the same time, it needs complex knowledge of materials, structure, failure mechanism, etc.; and the implementation is expensive and difficult

Method used

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  • Satellite element service life evaluation method based on aging test data before assembly
  • Satellite element service life evaluation method based on aging test data before assembly
  • Satellite element service life evaluation method based on aging test data before assembly

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Embodiment Construction

[0170] In the following, the present invention will be further described in detail in conjunction with the accompanying drawings and a life evaluation case of a typical satellite component.

[0171] The invention relates to a method for evaluating the life of satellite components based on aging test data before installation. The specific steps are as follows:

[0172] Step 1: Data Collection

[0173] The selected model is CD54HC238 typical star components, such as figure 2 shown. The burn-in test data is collected and organized as follows: a total of 124 components of this type have been subjected to burn-in tests, and the electrical performance parameters of the devices are tested at time 0, 48h and 96h respectively. There are 4 performance parameters, and the data obtained from the time 0, 48h and 96h tests are shown in Table 3 to Table 5. Due to the large number of devices, the first five devices are used as an example. If there is no explanation, the following are all...

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Abstract

The invention relates to a satellite element service life evaluation method based on aging test data before assembly. The method comprises the steps: starting with a failure mode and a failure mechanism in the actual application process of a satellite element through an accelerated degradation test theory model and combining with a space application environment, and building the degradation tracks of all electrical performances in the high-temperature aging test data; calculating the failure pseudo service lives of all electrical parameters through combining with the degradation tracks and failure threshold values of all electrical parameters; calculating the service life distribution of the element under high-temperature strain through the fitting pseudo service life distribution and multi-parameter pseudo service life distribution fusion; and finally carrying out the calculation of the service life of the element under the normal strain through determining an acceleration factor. The method belongs to the technical field of element reliability and service life evaluation.

Description

(1) Technical field: [0001] The invention relates to a method for evaluating the service life of satellite components based on aging test data before installation. It is based on the theoretical model of accelerated degradation test, combined with the aerospace environment, starting from the failure mode and failure mechanism of satellite components in the actual use process, and establishes the degradation trajectory of each electrical performance parameter in the high-temperature aging test data. After that, combined with the degradation trajectory and failure threshold of each electrical performance parameter, the failure pseudo-life of each electrical performance parameter is calculated. Furthermore, by fitting pseudo-lifetime distribution and multi-parameter pseudo-lifetime distribution fusion, the lifetime distribution of components under high temperature stress can be calculated. Finally, the life of the device under normal stress is calculated by determining the accel...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/00
CPCG01R31/003
Inventor 付桂翠钟凌程禹马程
Owner BEIHANG UNIV
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