Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Electromagnetic radiation analyzing method for integrated circuits

An integrated circuit, electromagnetic radiation technology, applied in the measurement of electricity, measurement of electrical variables, measurement devices, etc., can solve the problems of unsatisfactory accuracy and effect of simulation software, prediction, inability to complete the electromagnetic compatibility characteristics of integrated circuits, etc., to save measurement Time and measurement costs, the effect of improving the efficiency of analysis and forecasting

Inactive Publication Date: 2016-12-07
HARBIN ENG UNIV
View PDF3 Cites 10 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the accuracy and effect of the simulation software are not satisfactory
In many cases, the prediction of the electromagnetic compatibility characteristics of integrated circuits cannot even be completed
In addition, EMC simulation software requires accurate information such as the component composition, circuit design, wiring rules, and functions to be realized of the circuit board, and there is a risk of leaking confidential information in the circuit board.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Electromagnetic radiation analyzing method for integrated circuits
  • Electromagnetic radiation analyzing method for integrated circuits
  • Electromagnetic radiation analyzing method for integrated circuits

Examples

Experimental program
Comparison scheme
Effect test

Embodiment

[0032] Such as figure 1 As shown, the integrated circuit electromagnetic radiation analysis method of the embodiment of the present invention includes the following steps:

[0033]Step S11: Obtain the distance h from the surface of the integrated circuit when the integrated circuit is in the first working state 1 The tangential magnetic field strength and phase data H of m observation points on the first observation plane of ms ,in, with are the tangential magnetic field strength and phase component in the x-direction and y-direction obtained at the i-th observation point, respectively, 1≤i≤m;

[0034] Step S12: Determine the number of equivalent electric dipoles in the time-domain equivalent electric dipole model as n, where n≤m;

[0035] Step S13: According to the acquired tangential magnetic field strength and phase data H of the m observation points ms , solve the parameters of n equivalent electric dipoles in the time-domain equivalent electric dipole model, the pa...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention belongs to the technical field of electromagnetic compatibility, in particular to an electromagnetic radiation analyzing method for integrated circuits. The method of the invention comprises the following steps: acquiring tangential magnetic field intensity and phase data Hms of m observation points on the first observation plane, the distance of which to the surface of an integrated circuit is h1 during a first working state of the integrated circuit; determining the number of equivalent electric dipoles in a time-domain equivalent electric dipole model as n; and according to the acquired tangential magnetic field intensity and phase data Hms of m observation points on the first observation plane, seeking the parameters of the n equivalent electric dipoles in the time-domain equivalent electric dipole model. The electromagnetic radiation analyzing method for integrated circuits proposed by the invention realizes the time-domain equivalent electric dipole model of the integrated circuit, which can be used for accurately analyzing and predicting the electromagnetic compatibility performance through the measured data and the model operation, thereby saving the measuring time and measuring cost and improving the analysis and prediction efficiency.

Description

technical field [0001] The invention belongs to the technical field of electromagnetic compatibility, and in particular relates to a method for analyzing electromagnetic radiation of an integrated circuit. Background technique [0002] Integrated circuits include highly integrated active chips, passive lumped components, and integrated chips with different packaging structures. At the same time, the operating frequency in the integrated circuit increases, and the circuit structure becomes more complicated. The increase of circuit integration has aggravated the coupling phenomenon between equipment and boards, and the problems of signal distortion, crosstalk and electromagnetic radiation during circuit work have become more and more serious. [0003] On the other hand, high-density packaging is widely used in printed circuit board (Printed Circuit Board, hereinafter referred to as PCB) design, causing more electromagnetic interference problems between the PCB and the housing...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G01R31/00
CPCG01R31/002
Inventor 张兰勇杜逸璇刘胜李冰刘洪丹
Owner HARBIN ENG UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products