Test unit positioning mechanism of test equipment and test equipment provided with test unit positioning mechanism

Abstract

The present invention provides a test unit positioning mechanism of test equipment and test equipment provided with the test unit positioning mechanism. The bottom surface of the machine table of the test equipment is provided with a positioning mechanism. The positioning mechanism comprises a fixing plate provided with an accommodating space. At least one power source is arranged on the fixing plate. The power source drives at least one abutting member to move in at least one direction. A test unit comprises a carrier provided with a test bench. The test mechanism of the test unit drives the carrier to move into the accommodating space of the fixing plate. The positioning mechanism is driven by the power source to drive the abutting member to move, so that the carrier is pushed to attach to the machine table. In this way, the test unit provided with the test bench is positioned. During the replacement of the test bench, the positioning mechanism is driven by the power source to drive the abutting member to be separated from the carrier, so that the test unit with the test bench can be removed. The test mechanism drives the test unit to get away from the machine table. Therefore, the test unit provided with the test bench is automatically positioned or removed by the positioning mechanism, so that the replacement operation time is saved. As a result, the usage convenience and the production efficiency are improved.

Description

technical field [0001] The invention relates to a positioning mechanism capable of automatically positioning or removing a test unit with a test seat, saving the working time of replacing the test seat, and improving the convenience of use and production efficiency. Background technique [0002] Nowadays, after the electronic components are manufactured, they are transported to testing equipment for testing operations to eliminate defective products. Please refer to Figures 1, 2, and 3. The testing equipment is provided with a machine table 11 with an opening 111. The top of the machine platform 11 is provided with an outer cover 12 with an entrance and exit 121, and a test device 13 for testing electronic components is arranged below the machine platform 11. The test device 13 is provided with a tester connected to a central control unit (not shown). 131, the tester 131 is displaced in the first and second directions (such as X and Y directions) by the transfer structure (n...

AI Technical Summary

Problems solved by technology

[0003] 1. Since the base plate 134 of the test unit is locked on the tester 131, and the tester 131 is assembled under the machine table 11, there is no space under the machine table 11 for the staff to carry out the operation of locking the base board 134, so that The staff must perform the operation of locking the substrate 134 from the entrance and exit 121 of the outer cover 12, but the interior of the outer cover 12 is also equipped with other devices, so that the space is limited, which makes it quite inconvenient for the staff to perform the operation of locking the substrate 134 in a na

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