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A Method for Acquiring Characteristic Parameters of Concha Cavity

A technology of feature parameters and acquisition methods, applied in image data processing, instruments, calculations, etc., can solve the problem of customization methods relying on special, unable to meet popular customization needs, and achieve the effect of simplifying feature parameters.

Inactive Publication Date: 2018-01-23
XIAN MU SHENG ELECTRONICS TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The purpose of the present invention is to provide a method for obtaining the characteristic parameters of the concha cavity. Through the characteristic parameters, the model of the concha cavity can be obtained, so as to overcome the problem that the customization method in the prior art needs to rely on special materials or tools and cannot meet the needs of popular customization.

Method used

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  • A Method for Acquiring Characteristic Parameters of Concha Cavity
  • A Method for Acquiring Characteristic Parameters of Concha Cavity
  • A Method for Acquiring Characteristic Parameters of Concha Cavity

Examples

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Embodiment 1

[0033] Such as figure 1 It is a design flowchart of the first embodiment of the present invention, comprising the following steps:

[0034] Step 1, place a one-yuan coin next to the ear, the coin does not cover the ear, and the diameter of the coin is not blocked by other objects, and obtain the picture of the ear and the coin; figure 2 It is a schematic diagram of marking the feature points of the left ear in the first embodiment of the present invention; in the same way, the pictures of the coin and the other ear are obtained;

[0035] Step 2: Mark the feature points in the clockwise direction in the acquired right ear picture; mark the feature points in the counterclockwise direction in the acquired left ear picture; the marked feature points include the preauricular notch vertex 1, the tragus convex Starting point 2, highest point of tragus protrusion 3, end point of tragus protrusion 4, apex of intertragus notch 5, starting point of antitragus protrusion 6, highest poi...

Embodiment 2

[0041] On the basis of Example 1, further, the characteristic parameters of the concha cavity are obtained through the following steps:

[0042] Step 1, place the reference object next to the ear, the reference object does not cover the ear, and at the same time, a certain measurable length of the reference object is not blocked by other objects, and obtain the picture of the ear and the reference object; Figure 4 It is a schematic diagram of marking the feature points of the left ear in the second embodiment of the present invention. Taking a card as a reference object, mark the actual length of the visible side length of the card; use the same method to obtain the picture of the reference object and the other ear ;

[0043] Step 2: Mark the feature points in the clockwise direction in the acquired right ear picture; mark the feature points in the counterclockwise direction in the acquired left ear picture; the marked feature points include the preauricular notch vertex 1, the...

Embodiment 3

[0049] On the basis of Example 1, further, the characteristic parameters of the concha cavity are obtained through the following steps:

[0050] Step 1. Place the reference object next to the ear. The reference object does not cover the ear. At the same time, a certain measurable length of the reference object is not blocked by other objects. Get a picture of the ear and the reference object; use a card as the reference object, and mark the card The actual length of the visible side; in the same way, obtain a picture of the reference object and the other ear;

[0051] Step 2: Mark the feature points in the clockwise direction in the acquired right ear picture; mark the feature points in the counterclockwise direction in the acquired left ear picture; the marked feature points include the preauricular notch vertex 1, the tragus convex Starting point 2, highest point of tragus protrusion 3, end point of tragus protrusion 4, apex of intertragus notch 5, starting point of antitrag...

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Abstract

A method for acquiring feature parameters of ear conchae. By means of acquiring images of the ears and a reference object in a same scale, a customizing user having such need is allowed to provide conveniently the structures of the ear conchae while obviating the need for special materials and tools. By means of a method for marking feature points, the method for acquiring the feature parameters of the ear conchae is greatly simplified, and support for implementing mass customization is provided. By means of the establishment of a coordinate system, the positions of all of the feature points, the distances between same, and the positional relations therebetween can be conveniently acquired, and the feature parameters of the ear conchae are accurately acquired, thus acquiring the structures of the ear conchae. The method for acquiring the feature parameters of the ear conchae is simple and practicable and facilitates the customization of a popular ear-worn device.

Description

technical field [0001] The invention belongs to the technical field of ear wearing equipment customization, and in particular relates to a method for acquiring characteristic parameters of a concha cavity. Background technique [0002] The ear is a very important sensory organ of the human body and an important part of the human body to obtain external information and communicate. The structure of the human ear is complex and varied. The positional relationship between the tragus, the antitragus and the incision between the screens is uncertain, and the volume of the concha cavity is uncertain. The tragus, antitragus, concha cavity, and intertragus notch have different deformations. At the same time, because the fat layer of the epidermal tissue of the concha cavity is thin, the deformation caused by the compression of the earplug-type ear wearing equipment on the human ear will cause The pain in the human ear seriously affects the wearing experience. [0003] Therefore, i...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06T7/00
CPCG06T7/40
Inventor 俞辰周威岐维佳
Owner XIAN MU SHENG ELECTRONICS TECH CO LTD
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