A surface plasmon resonance microscopy imaging device and method

Abstract

The invention provides a surface plasma resonance microimaging device. A light source, an objective lens and a CCD camera form an SPR microimaging light path; light is split into S light and P light by arranging a PS light splitter between the objective lens and the camera; imaging is divided on the CCD camera; the disturbance of background noise can be reduced by controlling the movement of a sample to be tested through a mobile platform, and the smoothness of a base line can be improved to a great extent, so that clear nano particle signals can be obtained. The method can improve the problem of low signal-to-noise ratio due to fluctuation of the light source and the overall noise of machines during SPR imaging process and the problem of the influence on experimental observation and measurement of variation of nano particles caused by uneven imaging background due to light source problems, such as flaws of optical elements and interference of light.

Description

technical field [0001] The invention belongs to the field of instruments and equipment, and in particular relates to an SPR microscopic imaging device and method. Background technique [0002] Surface Plasmon Resonance (SPR) refers to a physical optical process in which free vibrational electrons existing on the metal surface are excited by light under certain conditions, and the energy of absorbed light resonates. [0003] When light is irradiated from an optically denser medium to an optically rarer medium, when the incident angle is greater than a certain angle (critical angle), the Total Internal Reflected (TIRF) phenomenon will occur, such as figure 1 shown. The incident light and the medium surface normal constitute the incident plane, and the electric field of the incident light wave can be decomposed into two mutually orthogonal polarized light components, one is the transverse magnetic wave in the incident plane, which is called TM wave or p-polarized wave; One is...

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Problems solved by technology

[0007] However, existing SPR imaging devices such as Figure 4 As shown, the signal-to-noise ratio is low due to the fluctuation of the light source and the overall mechanical noise during the imaging process, and the imaging background is not uniform due to optical component defects, light interference and other optical path problems, which affect the experimental observation and measurement of nanoparticle changes. question

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