Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

A kind of MAP data compression/restoration method and system in strip Test test process

A technology of data compression and recovery method, which is applied in the direction of electronic circuit testing, measuring electronics, measuring devices, etc., can solve the problems of unable to save the test map for a long time, and the map is too large, so as to improve the efficiency of testing and detection, avoid saving, and realize convenience and speed Effect

Active Publication Date: 2020-03-17
CHIPSEA TECH SHENZHEN CO LTD
View PDF7 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0007] In order to solve the above problems, the object of the present invention is to provide a MAP data compression / recovery method and system in the Strip Test test process, the method and the system method can solve the problem that the map is too large to store the test map for a long time

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A kind of MAP data compression/restoration method and system in strip Test test process
  • A kind of MAP data compression/restoration method and system in strip Test test process
  • A kind of MAP data compression/restoration method and system in strip Test test process

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0050] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0051] Such as figure 1 Shown, be the main control flowchart that the present invention realizes, among the figure, realization step comprises:

[0052] 1. Preparation stage. The preparation phase includes:

[0053] 201. Preparation stage one, passed Figure 5 The example of the special MAP file is shown, and the imaging algorithm is refined (that is, the test results are arranged as Figure 5 The visual chart shown, and then restore such a visual list of a special pattern through the algorithm, if the recovery is successful, the algorithm is considered to be established) for backup.

[0054] ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a MAP data compression / recovery method and system of the Strip Test technology. The MAP data compression / recovery method includes: adopting log files to acquire test result information and acquiring the log files; filtering the log files and storing binary streams only containing the test result information in an mysql database of a database storage module; an imaging module converting the binary streams into images. Through filtering of the log files, the effective test information is extracted and converted into the binary streams, storage of mass-data images is avoided, the log files can be greatly compressed, and the problems that a map is oversized and the test map cannot be stored are solved.

Description

technical field [0001] The invention belongs to the technical field of chip testing, and in particular relates to a method and system for compressing / recovering MAP data during the packaging and testing Strip Test process. Background technique [0002] Currently Strip Test is a relatively new IC packaging and testing technology. Compared with the traditional single test, it can greatly improve the test efficiency. For example, 128 / 256 parallel tests have been realized in the industry (via J750, KALOS series), and compared with the common 2 / 4 test of single test, its efficiency has increased by more than 60 times. [0003] The strip test process will generate map files and log files during the test process, both of which contain test result information. [0004] The map file stores the test results of all ICs on a frame (for example, the test results of 128 / 256 chips). It is very useful but not easy to store. The reason is that the file can be read directly in the form of...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/28
CPCG01R31/2896
Inventor 宋恩琳
Owner CHIPSEA TECH SHENZHEN CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com