Phased array self-aggregation probe, arc chipset and chip for detecting solid carriage axle

Abstract

The invention discloses a phased array self-aggregation probe, an arc chipset and a chip for detecting a solid carriage axle. A plurality of chips with curvature of 100 mm-300 mm form the arc chipset, the chips are arranged in a mode that a XY plane-coordinate system is established, the chips are bended along X-axis, and arranged along Y-axis in a line, wherein the curvature of the chips is 100 mm-300 mm. when used, the arc chipset is arranged on the phased array self-aggregation probe. The phased array self-aggregation probe comprises a probe body, and further comprises the arc chipset, and the frequency of the probe body is 1 MHz-17 MHz. The phased array self-aggregation probe is an arc probe, and the best bending curvature of the chip is provided according to the range (the journal diameter is in a range of 100 mm to 300 mm ) of the carriage axle in China, namely the curvature is 100 mm-300 mm. The phased array self-aggregation probe, the arc chipset and the chip can be compatible with all types of carriage axles, and the detection effect is improved.

Description

technical field [0001] The invention relates to the technical field of ultrasonic non-destructive testing, in particular to a phased array self-concentrating probe for testing a solid axle, an arc-shaped chip group and a chip. Background technique [0002] The country has gradually increased investment to support railway construction, and railway investment and construction is the focus of supervision and inspection in various places. With the rapid development of high-speed and heavy-duty railways, railways have already become a diplomatic business card and a new link between China and the world. Exporting railway equipment and technology overseas has become a reality. In particular, the opening of high-speed rail has put forward a new test for driving safety. The key components of the bogie, such as axles and bearings, are subject to greater stress at local locations, requiring faster testing, higher testing frequency, and expanded testing range, which puts forward higher...

AI Technical Summary

Problems solved by technology

Due to the complex structure of the axle and the limited space for the probe to be placed, it is necessary to place the probe at different positions for detection. During the test, the probe needs to be moved to complete the coverage detection of the entire embedded part. Frequent replacement and moving of the probe makes the coupling effect of the axle detection poor. , Low detection efficiency and prone to missed detection

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