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A power measurement device and method supporting hot plugging of power probes

A technology for power probes and power measurement, which is applied to measuring devices, electric power measurement by applying digital technology, and electrical devices, etc., can solve the problem of not being able to add additional circuits, achieve small hardware circuit changes, reduce required time, and improve The effect of testing efficiency

Active Publication Date: 2019-01-18
THE 41ST INST OF CHINA ELECTRONICS TECH GRP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In addition, due to the limitation of probe size and power consumption, no additional circuits can be added, and the general-purpose cable has no redundant signal lines for probe detection

Method used

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  • A power measurement device and method supporting hot plugging of power probes
  • A power measurement device and method supporting hot plugging of power probes
  • A power measurement device and method supporting hot plugging of power probes

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Embodiment Construction

[0022] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0023] Currently, existing power meters do not support hot-swap functionality. The purpose of the present invention is to not change the power probe and the multi-core cable in the power measuring device, only add some circuits to the power meter host, and judge whether the power probe is connected by reading the temperature and voltage of the probe, so as to realize the hot plugging of the power probe.

[0024] The power measurement device of the present inve...

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Abstract

The invention proposes a power measuring device that supports hot plugging of power probes, including: a power probe, a power meter host and cables, the power probe includes a detector head and a detector board, and a thermistor is set at the diode in the detector head to detect the working temperature , the temperature bias unit is set in the detection board to divide the temperature and voltage signal output by the thermistor, and enter the power meter host through the cable. After the temperature and voltage signal enters the power meter host, all the way through the ADC sampling unit, it enters the FPGA for temperature compensation. , all the way into the voltage comparison unit. The invention is compatible with the original power probe and multi-core cable, the hardware circuit of the power meter host is changed little, and the hot plug function can effectively reduce the time required for replacing the probe and improve the test efficiency.

Description

technical field [0001] The invention relates to the technical field of testing, in particular to a power measuring device supporting hot plugging of a power probe, and also to a power measuring method supporting hot plugging of a power probe. Background technique [0002] At present, the measurement of microwave and millimeter wave signal power mostly adopts the form of power meter host + multi-core cable + power probe. The main unit of the power meter can be equipped with multiple probes, and the power ranges and frequency ranges measured by different probes are different. In the test, it is often necessary to replace the power probe according to the change of the signal under test. The general method is to turn off the main unit of the power meter, replace the probe, and then turn on the main unit of the power meter. However, it takes quite a long time to power on and off the host of the power meter, especially the power on and off of the peak power analyzer installed wit...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R21/133G01R21/14
CPCG01R21/133G01R21/14
Inventor 李强李金山董占勇徐达旺
Owner THE 41ST INST OF CHINA ELECTRONICS TECH GRP
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