Signal nonlinear time-domain measurement and simulation method and application

A time-domain measurement and nonlinear technology, applied in the field of signal measurement to achieve the effect of metrology calibration

Active Publication Date: 2017-02-22
CHINA ACADEMY OF INFORMATION & COMM
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

From an application point of view, these parameters can only describe the distortion on the fundamental wave
Traditional vector network analyzers have limitations in describing nonlinear phenomena such as harmonics caused by nonlinear devices, so sometimes it is necessary to add descriptions of 2nd and 3rd harmonics
This description lacks an organic connection to the description of the nonlinear distortion on the fundamental and harmonics

Method used

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  • Signal nonlinear time-domain measurement and simulation method and application
  • Signal nonlinear time-domain measurement and simulation method and application
  • Signal nonlinear time-domain measurement and simulation method and application

Examples

Experimental program
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Embodiment 1

[0089] 1. Use a digital storage oscilloscope to measure and capture output waveforms at different input powers, and obtain a set of time domain sequences as shown in formula (8).

[0090] C dm (U in ,t)t∈[0,NT 0 ] (8)

[0091] C in formula (8) dm (t) is the measurement result of a digital storage oscilloscope, where the time t is discrete and can be transformed into an analytical function form through mathematical processing. Considering the correspondence with the multi-harmonic model, choose the form of trigonometric series, for C dm (t) Doing Fourier transform, the form of trigonometric series can be obtained, such as formula (9).

[0092]

[0093] In formula (8) and formula (9), N is the number of signal cycles captured. When N is large, the Fourier transform of formula (9) is sought. The existence of the averaging effect is beneficial to reduce the negative impact caused by the timing error and quantization error of the oscilloscope.

[0094] Based on the unifi...

Embodiment 2

[0110] use figure 2 The experimental device is used to measure a certain type of PA (the linear region gain is 38dB, the 1dB compression point is 37dBm, and the frequency band is 0.8GHz to 2.5GHz). The input CW frequency is set to 1GHz, and the power changes from -15dBm to 7dBm in steps of 0.2dB (the equivalent 50Ω port input amplitude changes from 0.056234V to 0.70795V).

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Abstract

The invention mainly belongs to the field of signal measurement and in particular relates to a signal nonlinear time-domain measurement and simulation method and application for nonlinear devices. A signal nonlinear time-domain measurement method caused by nonlinear devices such as power amplifiers, mixers and the like, does not need quadrature demodulation, directly measures the output waveforms of a nonlinear device at different input power of an input signal by using a digital storage oscilloscope to obtain a set of time-domain sequences. The time-domain sequences are transformed into analytic function forms by mathematical processing. When the period measured by the digital storage oscilloscope is N1, 0 to Nth-order Fourier transform is performed on the analytic function forms to obtain a complex function of the 0 to Nth-order Fourier series varying with input voltage, namely the 0 to Nth harmonics output by the no-linear device. The time-domain waveforms obtained by the measurement and simulation method are used to further obtain a segmented representing method of a fundamental wave and a measurement calibration method of a nonlinear microwave scattering parameter test instrument.

Description

technical field [0001] The invention mainly belongs to the field of signal measurement, and in particular relates to a nonlinear time-domain measurement and simulation method and application of a nonlinear device signal. Background technique [0002] In recent years, the nonlinear distortion of digital modulation signals caused by the nonlinear characteristics of nonlinear devices has become a research hotspot in the industry. [0003] The nonlinear distortion of nonlinear devices can easily cause vector demodulation diagram distortion and eye diagram distortion, etc. These distortions will cause obvious intersymbol interference and lead to system performance deterioration. [0004] As for the consequences caused by nonlinear distortion, part of the research point is the deterioration of system performance, and another part of the research point is the out-of-band interference caused by nonlinearity. From the spectrum point of view, nonlinear distortion is likely to cause o...

Claims

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Application Information

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IPC IPC(8): H04L25/03
CPCH04L25/03006H04L25/03082
Inventor 周峰马蓁张颖艳孟艾立张培艳孙景禄刘健哲熊宇飞
Owner CHINA ACADEMY OF INFORMATION & COMM
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