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Semiconductor integrated circuits and electronic control units

A technology of integrated circuits and semiconductors, applied in the field of microcontrollers, which can solve problems such as the inability to guarantee more scope and the inappropriate life expectancy.

Active Publication Date: 2020-03-31
RENESAS ELECTRONICS CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Also, while it can monitor temperature, it can't do much more than tell if it's out of warranty at that point, which is inappropriate for predicting lifetime

Method used

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  • Semiconductor integrated circuits and electronic control units
  • Semiconductor integrated circuits and electronic control units
  • Semiconductor integrated circuits and electronic control units

Examples

Experimental program
Comparison scheme
Effect test

no. 1 example

[0032] figure 1 is a block diagram showing an example of a schematic structure of the MCU 20 and the ECU 30 according to each embodiment. The ECU 30 is, for example, an ECU for controlling an engine coupled to an injector 32 and various types of sensors 31 , and includes an MCU 20 , a control MCU 21 for controlling the MCU 20 , a power supply for supplying power to the ECU 30 A circuit 22 and a clock oscillator 23 for supplying a clock signal. Wiring in the drawings is formed of any number of signal lines, one signal line or a plurality of signal lines, and so-called vector notation is omitted in the drawings. This applies to the other figures in this specification.

[0033] The MCU 20 includes a CPU 4, a flash ROM 5 as a nonvolatile memory, a nonvolatile memory control unit (flash controller) 6, a RAM 7 for temporarily storing data, and a bus for coupling these components to each other 11. In addition, it includes a timer 8 , an A / D converter 2 , a temperature sensor 1 ,...

no. 2 example

[0050] Figure 5is a signal flow view showing an operation example of the MCU 20 and the ECU 30 according to the second embodiment. In the first embodiment, the dedicated A / D converter 2_2 for temperature monitoring is provided so as to enable full-time monitoring of temperature. On the other hand, in the second embodiment, instead of the dedicated A / D converter 2_2 for temperature monitoring, the general A / D converter 2 as one of the peripheral circuit modules of the CPU 4 is used to perform A / D conversion of the obtained temperature. Other structures and operations and uses figure 2 The same as that of the first embodiment described; therefore, detailed description is omitted.

[0051] In the second embodiment, the temperature sensor 1 measures the temperature during the operation of the CPU 4 . The A / D converter 2 performs A / D for the measured values ​​input from various types of sensors 31 and for the temperature measured by the temperature sensor 1 along the flow of ...

no. 3 example

[0057] In the third embodiment, an appropriate MCU 20 and ECU 30 suitable for a vehicle such as a battery-mounted hybrid car or the like will be described. Even when the engine is not used (engine stop state), in other words, when the engine control ECU 30 is not operating, the hybrid car charges the battery and thus the charge control portion becomes extremely high temperature. Charging control is generally performed by another ECU and another MCU and the MCU 20 mounted on the engine control ECU 30 is generally in a standby state. When there is a heat source near the engine control ECU 30, thermal stress is continuously applied to the MCU 20 even when the installed MCU 20 is in a standby state; therefore, in order to ensure the reliability of the MCU 20, it is effective to Get thermal history under state.

[0058] Figure 8 is a signal flow view showing an operation example of the MCU 20 and the ECU 30 in the standby state according to the third embodiment. Since the engin...

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Abstract

In order to provide a semiconductor integrated circuit capable of predicting its own lifetime (wear out failure) due to the aged deterioration and notifying a warning, it includes a processor, a temperature sensor, a non-volatile memory, and a comparator formed on the same semiconductor substrate. The comparator compares a temperature measured by the temperature sensor with a predetermined temperature threshold, and the non-volatile memory accumulatively holds the information (cumulative time) about a period having the temperature exceeding the temperature threshold. The semiconductor integrated circuit notifies the outward of a warning when the cumulative time having the temperature exceeding the temperature threshold exceeds a predetermined high temperature time threshold.

Description

[0001] Cross References to Related Applications [0002] The disclosure of Japanese Patent Application No. 2015-168687 filed on Aug. 28, 2015 including specification, drawings and abstract is hereby incorporated by reference in its entirety. technical field [0003] The present invention relates to a semiconductor integrated circuit and an electronic control unit, and in particular, the present invention can be preferably applied to a microcontroller as a semiconductor integrated circuit mounted on an electronic control unit (ECU: Electronic Control Unit) requiring high reliability (hereinafter In this paper, it is sometimes referred to as MCU). Background technique [0004] In a semiconductor integrated circuit such as an MCU, the temperature at which normal operation is ensured is in many cases defined by the junction temperature Tj of the semiconductor. In an electronic control unit for controlling an MCU-mounted vehicle, especially when the electronic control unit is a...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01K13/00G01K1/02
CPCG01K1/02G01K13/00G01K2219/00G01K3/04
Inventor 藤崎敏朗玉置贵俊村山晓
Owner RENESAS ELECTRONICS CORP